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2011 | 119 | 4 | 514-520
Article title

Light-Emitting Diode Degradation and Low-Frequency Noise Characteristics

Content
Title variants
Languages of publication
EN
Abstracts
EN
Comprehensive investigation of phosphide-based red and nitride-based blue light-emitting diodes characteristics and physical processes that take place in device structure during aging has been carried out. Analysis of noise characteristics (the emitting-light power and the LED voltage fluctuations, also their cross-correlation factor) shows that investigated LEDs degradation is caused by defects that lead to the leakage current and non-radiating recombination increase in the active region or its interfaces. Appearance of the defects first of all manifests in noise characteristics: intensive and strongly correlated 1/f^{α} type optical and electrical fluctuations come out.
Keywords
Year
Volume
119
Issue
4
Pages
514-520
Physical description
Dates
published
2011-04
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv119n410kz
Identifiers
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