Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2011 | 119 | 2 | 274-276

Article title

Characterization of Optical and Photoelectrical Properties of ZnO Crystals

Content

Title variants

Languages of publication

EN

Abstracts

EN
We characterized optical and photoelectrical properties of undoped and Ga-doped ZnO layers differently grown on sapphire substrates by using complementary optical methods. Different stimulated emission threshold values for ZnO epitaxial layers grown by pulsed laser deposition and MBE methods were attributed to crystalline quality of the layers and the growth method used. Different carrier lifetimes in various ZnO epitaxial layers are explained by defect-related and intrinsic mechanisms of recombination.

Keywords

EN

Contributors

author
  • Institute of Applied Research, Vilnius University, Saulėtekio al. 9-III, LT 10222, Vilnius, Lithuania
  • Institute of Technical Physics, Riga Technical University, 14, Azenes Str., LV-1048, Riga, Latvia
  • Institute of Applied Research, Vilnius University, Saulėtekio al. 9-III, LT 10222, Vilnius, Lithuania
author
  • Institute of Applied Research, Vilnius University, Saulėtekio al. 9-III, LT 10222, Vilnius, Lithuania
author
  • Institute of Applied Research, Vilnius University, Saulėtekio al. 9-III, LT 10222, Vilnius, Lithuania
author
  • Institute of Technical Physics, Riga Technical University, 14, Azenes Str., LV-1048, Riga, Latvia
author
  • Physics Department, University of Central Florida, 4000 Central Florida Blvd., Orlando, Florida, 32816, USA
author
  • Institute of Applied Research, Vilnius University, Saulėtekio al. 9-III, LT 10222, Vilnius, Lithuania
author
  • Institute of Photonics and Optoelectronics, National Taiwan University, 1, Roosevelt Road, Taipei, Taiwan
author
  • Institute of Applied Research, Vilnius University, Saulėtekio al. 9-III, LT 10222, Vilnius, Lithuania

References

  • 1. C. Klingshirn, Chem. Phys. Chem. 8, 782 (2007)
  • 2. Ü. Özgür, I.Ya. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.-J. Cho, H. Morkoç, J. Appl. Phys. 98, 103 (2005)
  • 3. A. Shimizu, Jpn. J. Appl. Phys. 17, 1435 (1978)
  • 4. D.M. Bagnall, Y.F. Chen, Z. Zhu, T. Yao, M.Y. Shen, T. Goto, Appl. Phys. Lett. 73, 1038 (1998)
  • 5. K. Jarašiūnas, R. Aleksiejūnas, T. Malinauskas, M. Sūdžius, S. Miasojedovas, S. Juršėnas, A. Žukauskas, R. Gaska, J. Zhang, M.S. Shur, J.W. Yang, E. Kuokštis, M.A. Khan, Phys. Status Solidi A 202, 820 (2005)
  • 6. E. Burstein, Phys. Rev. 93, 632 (1954)
  • 7. T.S. Moss, Optical Properties of Semiconductors, Academic, New York 1961
  • 8. E. Kuokštis, M. Karaliūnas, S. Juršėnas, S. Miasojedovas, T. Serevičius, S.-Y. Ting, J.-J. Huang, C.-C. Yang, Phys. Status Solidi C 6, 2668 (2009)
  • 9. Ü. Özgür, A. Teke, C. Liu, S.-J. Cho, H. Morkoc, H.O. Everitt, Appl. Phys. Lett. 84, 3223 (2004)
  • 10. J. Fallert, F. Stelzl, H. Zhou, J. Korean Phys. Soc. 53, 2840 (2008)

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv119n257kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.