The Fast Differential Amplifier-Based Integrated Circuit Yield Analysis Technique

• Authors: A. Baskys , R. Navickas , C. Simkevicius
• Languages of publication: EN

Abstracts

EN

The fast differential amplifier-based integrated circuit yield analysis technique, which enables determining the interrelation between the integrated circuit yield and dimensions of circuit elements, has been presented. The technique is based on the common use of experimental statistical analysis and statistical modeling as well as on the introduction of the concept of the integrated circuit intermediate parameters. The results of yield analysis of the concrete integrated circuit based on the differential amplifiers are presented.

Keywords

EN

85.30.De; 85.30.Pq; 85.40.Bh; 85.40.Qx

Discipline

• 85.40.Bh: Computer-aided design of microcircuits; layout and modeling
• 85.30.De: Semiconductor-device characterization, design, and modeling
• 85.40.Qx: Microcircuit quality, noise, performance, and failure analysis
• 85.30.Pq: Bipolar transistors

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 119
• Issue: 2
• Pages: 259-261

Dates

published

2011-02

Contributors

author

A. Baskys

• Center for Physical Sciences and Technology, A. Gostauto 11, 01108 Vilnius, Lithuania
• Vilnius Gediminas Technical University, Naugarduko 41, LT-03227 Vilnius, Lithuania

author

R. Navickas

• Vilnius Gediminas Technical University, Naugarduko 41, LT-03227 Vilnius, Lithuania

author

C. Simkevicius

• Center for Physical Sciences and Technology, A. Gostauto 11, 01108 Vilnius, Lithuania

References

• 1. L. Bo, F.V. Fernandez, D. De Jonghe, G. Gielen, in: Proc. Electronics, Circuits, and Systems Conf. ICECS 2009, Ed. A. Hamoui, IEEE, New York 2009, p. 267
• 2. A.R. Alvarez, B.L. Abdi, D.L. Young, H.D. Weed, J. Teplik, E.R. Herald, IEEE Trans. Computer-Aided Des. 7, 272 (1988)
• 3. G.E. Box, D.W. Benken, Technometrics 4, 455 (1980)

Identifiers

DOI

10.12693/APhysPolA.119.259