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2011 | 119 | 2 | 259-261
Article title

The Fast Differential Amplifier-Based Integrated Circuit Yield Analysis Technique

Content
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Languages of publication
EN
Abstracts
EN
The fast differential amplifier-based integrated circuit yield analysis technique, which enables determining the interrelation between the integrated circuit yield and dimensions of circuit elements, has been presented. The technique is based on the common use of experimental statistical analysis and statistical modeling as well as on the introduction of the concept of the integrated circuit intermediate parameters. The results of yield analysis of the concrete integrated circuit based on the differential amplifiers are presented.
Keywords
Contributors
author
  • Center for Physical Sciences and Technology, A. Gostauto 11, 01108 Vilnius, Lithuania
  • Vilnius Gediminas Technical University, Naugarduko 41, LT-03227 Vilnius, Lithuania
author
  • Vilnius Gediminas Technical University, Naugarduko 41, LT-03227 Vilnius, Lithuania
  • Center for Physical Sciences and Technology, A. Gostauto 11, 01108 Vilnius, Lithuania
References
  • 1. L. Bo, F.V. Fernandez, D. De Jonghe, G. Gielen, in: Proc. Electronics, Circuits, and Systems Conf. ICECS 2009, Ed. A. Hamoui, IEEE, New York 2009, p. 267
  • 2. A.R. Alvarez, B.L. Abdi, D.L. Young, H.D. Weed, J. Teplik, E.R. Herald, IEEE Trans. Computer-Aided Des. 7, 272 (1988)
  • 3. G.E. Box, D.W. Benken, Technometrics 4, 455 (1980)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv119n252kz
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