Infrared Reflectance Kramers-Kronig Analysis by Anchor-Window Technique

• Authors: S. Tumėnas , I. Kašalynas , V. Karpus , H. Arwin
• Languages of publication: EN

Abstracts

EN

An algorithm for the Kramers-Kronig analysis of the reflectivity spectra, based on an anchor-window technique is presented. The high-frequency asymptote, required for the Kramers-Kronig analysis, is determined by minimizing differences between the Kramers-Kronig-deduced optical constants of a system under investigation and known optical constants measured in a small anchor-window. The algorithm is illustrated by applying it for a reconstruction of the optical conductivity σ(ω) of the fci-ZnMgRE quasicrystals in the spectral range of 0.01-6.5 eV from the experimental IR Fourier-transform reflectivity data and the experimental spectral ellipsometry VIS-UV data. The reliability of the suggested Kramers-Kronig analysis technique is confirmed by independent infrared spectral ellipsometry σ(ω) measurements for fci-ZnMgRE.

Keywords

EN

71.23.Ft; 78.20.Ci

Discipline

• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 71.23.Ft: Quasicrystals

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 119
• Issue: 2
• Pages: 140-142

Dates

published

2011-02

Contributors

author

S. Tumėnas

• Center for Physical Sciences and Technology, Semiconductor Physics Institute, A. Goštauto 11, 01108 Vilnius, Lithuania

author

I. Kašalynas

• Center for Physical Sciences and Technology, Semiconductor Physics Institute, A. Goštauto 11, 01108 Vilnius, Lithuania

author

V. Karpus

• Center for Physical Sciences and Technology, Semiconductor Physics Institute, A. Goštauto 11, 01108 Vilnius, Lithuania

author

H. Arwin

• Department of Physics, Chemistry and Biology, Linköping University, 58183 Linköping, Sweden

References

• 1. A. Langsdorf, W. Assmus, J. Cryst. Growth 192, 152 (1998)
• 2. K.-E. Peiponen, J.J. Saarinen, Rep. Prog. Phys. 72, 1 (2009)
• 3. R.K. Ahrenkiel, J. Opt. Soc. Am. 61, 1651 (1971)

Identifiers

DOI

10.12693/APhysPolA.119.140