Charge Carrier Transport in Non-Homogeneous MDMO-PPV Polymer

• Authors: V. Kažukauskas , M. Pranaitis , V. Janonis
• Languages of publication: EN

Abstracts

EN

By thermally stimulated currents we have investigated carrier transport and trapping in [poly-(2-methoxyl, 5-(3,77dimethyloctyloxy)] paraphenylenevinylene (MDMO-PPV). To assure selective excitation of the defect states the spectral width of the exciting light was varied from 1.77 eV up to 3.1 eV. The thermally stimulated current curves were shown to be a superposition of carrier generation from trapping states and thermally stimulated mobility growth. The extrinsic excitation resulted in 0.16 eV photoconductivity effective activation energy values, which decreased down to 0.05 eV for the intrinsic excitation. The deeper states with activation energies of 0.28-0.3 eV and 0.8-0.85 eV were identified, too. The results are direct indication of distributed in energy trapping and transport states with the standard deviation of the density of states of about 0.015 eV.

Keywords

EN

73.20.Hb; 73.50.Gr; 73.50.Pz; 73.61.Ph

Discipline

• 73.20.Hb: Impurity and defect levels; energy states of adsorbed species
• 73.61.Ph: Polymers; organic compounds
• 73.50.Pz: Photoconduction and photovoltaic effects
• 73.50.Gr: Charge carriers: generation, recombination, lifetime, trapping, mean free paths

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 119
• Issue: 2
• Pages: 128-130

Dates

published

2011-02

Contributors

author

V. Kažukauskas

• Department of Semiconductor Physics and Institute of Applied Research, Vilnius University, Saulėtekio 9, bldg. 3, LT-10222 Vilnius, Lithuania

author

M. Pranaitis

• Department of Semiconductor Physics and Institute of Applied Research, Vilnius University, Saulėtekio 9, bldg. 3, LT-10222 Vilnius, Lithuania

author

V. Janonis

• Department of Semiconductor Physics and Institute of Applied Research, Vilnius University, Saulėtekio 9, bldg. 3, LT-10222 Vilnius, Lithuania

References

• 1. P.W.M. Blom, M.J.M. de Jong, J.J.M. Vleggaar, Appl. Phys. Lett. 68, 3308 (1996)
• 2. H. Antoniadis, M.A. Abkowitz, B.R. Hsieh, Appl. Phys. Lett. 65, 2030 (1994)
• 3. J. Nelson, Phys. Rev. B 67, 155209 (2003)
• 4. A.J. Campbell, D.D.C. Bradley, E. Werner, W. Bruetting, Org. Electron. 1, 21 (2000)
• 5. L. Gorisa, A. Poruba, L. Hod'ákova, M. Vaněček, K. Haenen, M. Nesládek, P. Wagner, D. Vanderzande, L. De Schepper, J.V. Mancab, Appl. Phys. Lett. 88, 052113 (2006)
• 6. J. Steiger, R. Schmechel, H. Von Seggern, Synth. Met. 129, 1 (2002)
• 7. T.P. Nguyen, P. Le Rendu, P. Leveque, J. Ip, O. Gaudin, R.B. Jackman, Org. Electron. 5, 53 (2004)
• 8. V. Kažukauskas, Semicond. Sci. Technol. 19, 1373 (2004)
• 9. V. Kažukauskas, A. Arlauskas, M. Pranaitis, M. Glatthaar, A. Hinsch, J. Nanosci. Nanotechnol. 10, 1376 (2010)
• 10. J.G. Simmons, G.W. Taylor, Phys. Rev. B 5, 1619 (1972)
• 11. H. Baessler, Phys. Status Solidi 175, 15 (1993)
• 12. A.J. Mozer, N.S. Sariciftci, A. Pivrikas, R. Österbacka, G. Juška, L. Brassat, H. Bässler, Phys. Rev. B 71, 035214 (2005)
• 13. V. Kažukauskas, M. Pranaitis, V. Čyras, L. Sicot, F. Kajzar, Thin Solid Films 516, 8988 (2008)
• 14. G. Dennler, A.J. Mozer, G. Juška, A. Pivrikas, R. Osterbacka, A. Fuchsbauer, N.S. Sariciftci, Org. Electron. 7, 229 (2006)
• 15. M.M. Mandoc, W. Veurman, L.J.A. Koster, M.M. Koetse, J. Sweelssen, B. de Boer, P.W.M. Blom, J. Appl. Phys. 101, 104512 (2007)

Identifiers

DOI

10.12693/APhysPolA.119.128