PL EN


Preferences help
enabled [disable] Abstract
Number of results
2010 | 118 | 2 | 375-378
Article title

Current-Voltage Characteristics of Nanowires Formed at the Co-Ge_{99.99}Ga_{0.01} Interface

Content
Title variants
Languages of publication
EN
Abstracts
EN
We present a method of measurement of the current-voltage (I-V) and conductance-voltage (G-V) characteristics of nanowires with quantum point contact formed at the Co-Ge_{99.99}Ga_{0.01} interface. The effect of the Fermi level pinning leads to the formation of an ohmic contact between Co and Ge_{99.99}Ga_{0.01}. On the measured characteristics, above the threshold value of voltage an exponential current growth is observed. Such effect could be useful in the production of the electronic nanodevices.
Keywords
EN
Contributors
author
  • Faculty of Electronics and Telecommunications, Poznań University of Technology, Piotrowo 3A, 60-965 Poznań, Poland
author
  • Faculty of Electronics and Telecommunications, Poznań University of Technology, Piotrowo 3A, 60-965 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
References
  • 1. Y. Cui, C.M. Lieber, Science 291, 851 (2001)
  • 2. J.-R. Kim, H. Oh, H.M. So, J. Kim, J.-J. Kim, Physica E 18, 225 (2003)
  • 3. M.-C. Jeong, B.-Y. Oh, M.-H. Ham, J.-M. Myoung, Appl. Phys. Lett. 88, 202105 (2006)
  • 4. P.-C. Chang, Z. Fan, C.-J. Chien, D. Stichtenoth, C. Ronning, J.G. Lua, Appl. Phys. Lett. 89, 133113 (2006)
  • 5. Z.Y. Fan, D.W. Wang, P.C. Chang, W.Y. Tseng, J.G. Lu, Appl. Phys. Lett. 85, 5923 (2004)
  • 6. Z.Y. Fan, J.G. Lu, Appl. Phys. Lett. 86, 123510 (2005)
  • 7. J.I. Pascual, J. Méndez, J. Gómez-Herrero, A.M. Baró, N. García, Vu Thien Binh, Phys. Rev. Lett. 71, 1852 (1993)
  • 8. J.M. Krans, J.M. van Ruitenbeek, V.V. Fisun, I.K. Yanson, L.J. de Jongh, Nature 375, 767 (1995)
  • 9. M. Brandbyge, J. Schiotz, M.R. Sorensen, P. Stoltze, K.W. Jacobsen, J.K. Norskov, L. Olesen, E. Laegsgaard, I. Stensgaard, F. Besenbacher, Phys. Rev. B 52, 8499 (1995); K. Hansen, E. Lagsgaard, I. Stensgaard, F. Besenbacher, Phys. Rev. B 56, 2208 (1997)
  • 10. C.J. Muller, J.M. van Ruitenbeek, L.J. de Jongh, Physica C 191, 485 (1992)
  • 11. K. Hansen, S.K. Nielsen, E. Lagsgaard, I. Stensgaard, F. Besenbacher, Rev. Sci. Instrum. 71, 1793 (2000)
  • 12. J.L. Costa-Krämer, N. García, P. García-Mochales, P.A. Serena, M.I. Marqués, A. Correia, Phys. Rev. B 55, 5416 (1997)
  • 13. K. Hansen, S.K. Nielsen, M. Bradbyge, E. Lagsgaard, I. Stensgaard, F. Besenbacher, Appl. Phys. Lett. 77, 708 (2000)
  • 14. M. Yoshida, Y. Oshima, K. Takayanagi, Jpn. J. Appl. Phys. 44, L1178 (2005)
  • 15. M. Yoshida, Y. Oshima, K. Takayanagi, Appl. Phys. Lett. 87, 33 (2005)
  • 16. M. Wawrzyniak, J. Martinek, B. Susła, J. Phys., Conf. Ser. 146, 012035 (2009)
  • 17. A. Dimoulas, P. Tsipas, A. Sotiropoulos, E.K. Evangelou, Appl. Phys. Lett. 89, 252110 (2006)
  • 18. R.R. Lieten, S. Degroote, M. Kuijk, G. Borghs, Appl. Phys. Lett. 92, 022106 (2008)
  • 19. M. Wawrzyniak, Metrol. Measur. Syst. 14, 391 (2007)
  • 20. T. Nishimura, K. Kita, A. Toriumi, Appl. Phys. Lett. 91, 123123 (2007)
  • 21. M. Wawrzyniak, Metrol. Measur. Syst. 13, 161 (2006)
  • 22. D. Wang, J.G. Lu, C.J. Otten, W.E. Buhro, Appl. Phys. Lett. 83, 5280 (2003)
  • 23. D.-I. Kim, N. Pradeep, F.W. DelRio, R.F. Cook, Appl. Phys. Lett. 93, 203102 (2008)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv118n238kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.