PL EN


Preferences help
enabled [disable] Abstract
Number of results
2010 | 117 | 1 | 234-237
Article title

Temperature Sensitive Spinel-Type Ceramics in Thick-Film Multilayer Performance for Environment Sensors

Content
Title variants
Languages of publication
EN
Abstracts
EN
Temperature sensitive thick films based on spinel-type semiconducting ceramics of different chemical composition Cu_{0.1}Ni_{0.1}Co_{1.6}Mn_{1.2}O_{4} (with p^{+}-types of electrical conductivity), Cu_{0.1}Ni_{0.8}Co_{0.2}Mn_{1.9}O_{4} (with p-types of electrical conductivity) and their multilayer p^{+}-p structures were fabricated and studied. These thick-film elements possess good electrophysical characteristics before and after long-term ageing test at 170°C. It is shown that degradation processes connected with diffusion of metallic Ag into film grain boundaries occur in one-layer p- and p^{+}-conductive thick films. The p^{+}-p structures were of high stability, the relative electrical drift was not greater than 1%.
Keywords
EN
Contributors
author
  • Lviv Institute of Materials of Scientific Research Company "Carat", Stryjska 202, 79031 Lviv, Ukraine
author
  • Lviv Institute of Materials of Scientific Research Company "Carat", Stryjska 202, 79031 Lviv, Ukraine
  • Lviv Polytechnic National University, Bandera 12, 79013 Lviv, Ukraine
author
  • Lviv Institute of Materials of Scientific Research Company "Carat", Stryjska 202, 79031 Lviv, Ukraine
  • Institute of Physics of Jan Długosz University of Czestochowa, al. Armii Krajowej 13/15, 42-201 Częstochowa, Poland
author
  • Fachhochschule Köln/University of Applied Sciences, Betzdorfer 2, 50679 Köln, Germany
References
  • 1. M. Vakiv, O. Shpotyuk, O. Mrooz, I. Hadzaman, J. Europ. Ceram. Soc. 21, 1783 (2001)
  • 2. M.M. Vakiv, I.V. Hadzaman, A.P. Kovalskiy, M.M. Kravtsiv, O.Ya. Mrooz, O.I. Shpotyuk, Patent of Ukraine No. 47534, H01C7/04, H01C7/13, C04B35/00 / C04B101:00, Prior.: 06.04.2000
  • 3. V.I. Zaharov, A.O. Olesk, Elektronnaja Tehnika, Ser. Radiodetali i Komponenty 65, 30 (1989)
  • 4. V.I. Zaharov, A.O. Olesk, Zarubeznaja Elektronnaja Tehnika 5, 43 (1983)
  • 5. J. Zhong, H.H. Bau, Am. Ceram. Soc. Bull. 80, 39 (2001)
  • 6. A.H. Feingold, R.L. Wahlers, P. Amstutz, C. Huang, S.J. Stein, J. Mazzochette, Microwave J. 1, 90 (2000)
  • 7. W. Qu, Meas. Sci. Technol. 11, 1111 (2000)
  • 8. N.W. White, J.D. Turner, Meas. Sci. Technol. 8, 1 (1997)
  • 9. A. Dziedzic, Meas. Sci. Technol. 8, 78 (1997)
  • 10. I. Vynnyk, I. Hadzaman, H. Klym, O. Mrooz, O. Shpotyuk, Technology and Design in Electronics 2, 60 (2006)
  • 11. J. Rodriguez-Carvajal, in: Abstr. Satellite Meeting on Powder Diffraction of the XV Congress of the IUCr, Toulouse, France 1990, p. 127
  • 12. T. Roisnel, J. Rodriguez-Carvajal, in: Materials Science Forum, Proc. Seventh European Powder Diffraction Conference (EPDIC 7), Barcelona, 2000, p. 118
  • 13. O. Mrooz, I. Hadzaman, M. Vakiv, O. Shpotyuk, J. Plewa, H. Altenburg, H. Uphoff, in: Proc. 23rd Int. Conf. Microelectronics (MIEL 2002), Yugoslavia, Vol. 1, 2002, p. 375
  • 14. O. Bodak, L. Akselrud, P. Demchenko, B. Kotur, O. Mrooz, J. Alloys Comp. 374, 12 (2002)
  • 15. H. Klym, I. Hadzaman, O. Shpotyuk, M. Brunner, in: Proc. 14th Int. Conf. on Sensors, Technologies, Electronics and Applications, Germany, Vol. 2, 2009, p. 74
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv117z148kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.