Nanostructured Materials for Optoelectronic Applications

• Authors: N. Kamanina , P. Vasilyev , S. Serov , V. Savinov , K. Bogdanov , D. Uskokovic
• Languages of publication: EN

Abstracts

EN

Study and optimization of new nanoscale materials useful for optoelectronic application have been considered. The search for the effective nanostructured materials has been revealed in two directions: to optimize the mechanical hardness of the inorganic systems and to increase the photorefractive parameters of the organics with nanoobjects. It has been testified that the surface mechanical properties of the inorganic materials via nanotubes treatment process can be drastically improved. For example, the surface mechanical hardness of the UV and IR range soft materials can be increased up to 3-10 times under the conditions of oriented nanotubes placement. It has been obtained that the nonlinear optical characteristics (nonlinear refraction n_{2} and cubic nonlinearity χ^{(3)}) of the organics thin films sensitized with fullerenes or nanotubes can be increased up to 3-4 orders of magnitude in comparison with the same parameters for bulk materials traditionally used for nonlinear optics.

Keywords

EN

42.70.-a; 42.79.-e; 78.20.-e; 78.30.Na

Discipline

• 42.70.-a: Optical materials(see also 81.05.-t Specific materials: fabrication, treatment, testing and analysis)
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 42.79.-e: Optical elements, devices, and systems(for integrated optics, see 42.82.-m; for fiber optics, see 42.81.-i)
• 78.30.Na: Fullerenes and related materials

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 117
• Issue: 5
• Pages: 786-790

Dates

published

2010-05

Contributors

author

N. Kamanina

• Vavilov State Optical Institute, 12 Birzhevaya Line, St. Petersburg, 199034, Russia

author

P. Vasilyev

• Vavilov State Optical Institute, 12 Birzhevaya Line, St. Petersburg, 199034, Russia

author

S. Serov

• Vavilov State Optical Institute, 12 Birzhevaya Line, St. Petersburg, 199034, Russia

author

V. Savinov

• Vavilov State Optical Institute, 12 Birzhevaya Line, St. Petersburg, 199034, Russia

author

K. Bogdanov

• State Educational Institute Lyceum No. 1186, Moscow, Russia

author

D. Uskokovic

• Institute of Technical Sciences of the SASA, Belgrade, Serbia

References

• 1. W. Krätschmer, L.D. Lamb, K. Fostiropoulos, Nature, 347, 354 (1990)
• 2. J. Robertson, Material Today 7, 46 (2004)
• 3. Ch. Pul, F. Owns, Nanotechnology, Technosphere, Moscow 2007, p. 119
• 4. N.V. Kamanina, P.Ya. Vasilyev, V.I. Studeonov, Yu.E. Usanov, Optical Zhournal 75, 83 (2008)
• 5. N.V. Kamanina, P.Ya. Vasilyev, V.I. Studeonov, Optical Zhournal 75, 57 (2008)
• 6. S. Namilae, N. Chandra, C. Shet, Chem. Phys. Lett. 387, 247 (2004)
• 7. N.V. Kamanina, D.P. Uskokovic, Materials and Manufacturing Processes 23, 552 (2008)
• 8. N.V. Kamanina, A. Emandi, F. Kajzar, A.-J. Attias, Mol. Cryst. Liq. Cryst. 486, 1043 (2008)
• 9. R.J. Collier, C.B. Burckhardt, L.H. Lin, Optical Holography, Mir, Moscow 1973; p. 686
• 10. S.A. Akhmanov, S.Yu. Nikitin, Physical Optics, Moscow University Press, Moscow 1997, p. 498

Identifiers

DOI

10.12693/APhysPolA.117.786