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2010 | 117 | 3 | 493-496
Article title

Frequency Dependent Electrical Characteristics οf Au/n-Si/CuPc/Au Heterojunction

Content
Title variants
Languages of publication
EN
Abstracts
EN
Electrical characteristics of the heterojunction fabricated by thermal deposition of copper phthalocyanine (CuPc) on an n-silicon substrate have been investigated. The frequency has significant effect on capacitance (C), conductance (G) and series resistance (R_{s}) interface states (D_{it}) of the junction. Measured capacitance and conductance were corrected for R_{s}. The conductance technique was used to measure the density of the interface states. This method revealed the value of the interface state density distribution for the Au/n-Si/CuPc/Au interfaces of the order of 10^{12} cm^{-2} eV^{-1}.
Keywords
EN
Year
Volume
117
Issue
3
Pages
493-496
Physical description
Dates
published
2010-03
received
2008-02-14
(unknown)
2009-10-19
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv117n312kz
Identifiers
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