Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2010 | 117 | 2 | 379-383

Article title

Kinetic Roughening and Material Optical Properties Influence on Van der Waals/Casimir Forces

Content

Title variants

Languages of publication

EN

Abstracts

EN
Atomic force microscopy measurements and force theory calculations using the Lifshitz theory show that van der Waals/Casimir dispersive forces have a strong dependence on surface roughness and material optical properties. It is found that at separations below 100 nm the roughness effect is manifested through a strong deviation from the normal scaling of the force with separation distance. Moreover, knowledge of precise optical properties of metals is shown to be very important for accurate force predictions rather than referring to idealized defect free material models. Finally, we compare the van der Waals/Casimir forces to capillary adhesive forces in order to illustrate their significance in stiction problems.

Keywords

Contributors

author
  • Materials innovation institute M2i and Zernike Institute for Advanced Materials, University of Groningen, 9747 AG Groningen, Netherlands
  • Materials innovation institute M2i and Zernike Institute for Advanced Materials, University of Groningen, 9747 AG Groningen, Netherlands

References

  • 1. H.B.G. Casimir, Proc. K. Ned. Akad. Wet. 51, 793 (1948). For initial measurements of the Casimir effect see: M.J. Sparnaay, Physica (Utrecht)g 24, 751 (1958); P.H.G.M. van Blockland, J.T.G. Overbeek, J. Chem. Soc. Faraday Trans. 74, 2637 (1978)
  • 2. F.M. Serry, D. Walliser, G.J. Maclay, J. Appl. Phys. 84, 2501 (1997); H.B. Chan, V.A. Aksyuk, R.N. Kleiman, D.J. Bishop, F. Capasso, Scienceg 291, 1941 (2001); G. Palasantzas, J.Th.M. De Hosson, Phys. Rev. B 72, 115426 (2005); ibid Phys. Rev. B 72, 121409 (2005); G. Palasantzas, J.Th.M. De Hosson, Surf. Sci. 600, 1450 (2006)
  • 3. R. Onofrio, New J. Phys. 8, 237 (2006)
  • 4. S.K. Lamoreaux, Phys. Rev. Lett 78, 5 (1997); S.K. Lamoreaux, Phys. Rev. Lett. 83, 3340 (1999); S.K. Lamoreaux, Phys. Today, (2007)
  • 5. B.W. Harris, F. Chen, U. Mohideen, Phys. Rev. A 62, 052109 (2000)
  • 6. E.M. Lifshitz, Zh. Eksp. Teor. Fiz. 29, 94 (1956) [ Sov. Phys. JETP 2, 73 (1956)]; I.E. Dzyaloshinskii, E.M. Lifshitz, L.P. Pitaevskii, Advances in Physics 38, 165 (1961); E.M. Lifshitz, L.P. Pitaevskii, Statistical Physics, Part 2, Pergamon Press, Oxford 1980
  • 7. I. Pirozhenko, A. Lambrecht, V.B. Svetovoy, New J. Phys. 8, 238 (2006)
  • 8. V.B. Svetovoy, P.J. van Zwol, G. Palasantzas, J.Th.M. De Hosson, Phys. Rev. B 77, 035439 (2008); P.J. van Zwol, G. Palasantzas, J.Th.M. DeHosson, Appl. Phys. Lett. 91, 144108 (2007)
  • 9. P.A. Maia-Neto, A. Lambrecht, S. Reynaud, Phys. Rev. A 72, 012115 (2005); P.A. Maia-Neto, A. Lambrecht, S. Reynoud, Europhys. Lett. 69, 924 (2005)
  • 10. P.J. van Zwol, G. Palasantzas, J.Th.M. De Hosson, to appear in Phys. Rev. B (2008); P.J. van Zwol, G. Palasantzas, M. van de Schootbrugge, J.Th.M. De Hosson, Appl. Phys. Lett. 92, 054101 (2008)
  • 11. G. Palasantzas, Phys. Rev. E 56, 1254 (1997)
  • 12. P. Meakin, Phys. Rep. 235, 1991 (1994); J. Krim, G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995)
  • 13. G. Palasantzas, Phys. Rev. B 48, 14472 (1993); 49, 5785 (1994); G. Palasantzas, J. Krim, Phys. Rev. Lett. 73, 3564 (1994)
  • 14. A. Ata, Y.I. Rabinovich, R.K. Singh, J. Adhesion, Sci. Technol. 16, 337 (2002)
  • 15. P.J. van Zwol, G. Palasantzas, J.Th.M. de Hosson, Phys. Rev. E 78, 031606 (2008); P.J. van Zwol, G. Palasantzas, J.Th.M. DeHosson, Appl. Phys. Lett. 91, 101905 (2007)
  • 16. M.E. Abdelsalam, P.N. Bartlett, T. Kelf, J. Baumberg, Langmuirg 21, 1753 (2005)

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv117n254kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.