Hard X-ray Microscopy with Elemental, Chemical and Structural Contrast

• Authors: C. Schroer , P. Boye , J. Feldkamp , J. Patommel , A. Schropp , D. Samberg , S. Stephan , M. Burghammer , S. Schöder , C. Riekel , B. Lengeler , G. Falkenberg , G. Wellenreuther , M. Kuhlmann , R. Frahm , D. Lützenkirchen-Hecht , W. Schroeder
• Languages of publication: EN

Abstracts

EN

We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.

Keywords

EN

68.37.Yz; 41.40.th

Discipline

• 68.37.Yz: X-ray microscopy

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 117
• Issue: 2
• Pages: 357-368

Dates

published

2010-02

Contributors

author

C. Schroer

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

P. Boye

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

J. Feldkamp

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

J. Patommel

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

A. Schropp

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

D. Samberg

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

S. Stephan

• Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany

author

M. Burghammer

• ESRF, B.P. 220, F-38043 Grenoble, France

author

S. Schöder

• ESRF, B.P. 220, F-38043 Grenoble, France

author

C. Riekel

• ESRF, B.P. 220, F-38043 Grenoble, France

author

B. Lengeler

• II. Physikalisches Institut, RWTH Aachen University, D-52056 Aachen, Germany

author

G. Falkenberg

• HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany

author

G. Wellenreuther

• HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany

author

M. Kuhlmann

• CELLS HALBA, Cerdanyola del Vallès, Barcelona, Spain

author

R. Frahm

• Institute of Materials Science and Department of Physics, Bergische Universität Wuppertal, 20 Gauss Str. 20, D-42097 Wuppertal, Germany

author

D. Lützenkirchen-Hecht

• Institute of Materials Science and Department of Physics, Bergische Universität Wuppertal, 20 Gauss Str. 20, D-42097 Wuppertal, Germany

author

W. Schroeder

• ICG-3, Forschungszentrum Jülich, Germany Jülich GmbH, 52425 Jülich Germany

References

• 1. J.-D. Grunwaldt, S. Hannemann, C.G. Schroer, A. Baiker, J. Phys. Chem. B 110, 8674 (2006)
• 2. B. Kimmerle, J.-D. Grunwaldt, A. Baiker, P. Glatzel, P. Boye, S. Stephan, C.G. Schroer, J. Phys. Chem. C 113, 3037 (2009)
• 3. S. Bohic, A. Simionovici, A. Snigirev, R. Ortega, G. Devès, D. Heymann, C.G. Schroer, Appl. Phys. Lett. 78, 3544 (2001)
• 4. A. Carmona, P. Cloetens, G. Deves, S. Bohic, R. Ortega, J. Analytical Atomic Spectrometryg 23, 1083 (2008)
• 5. R.H. Mathiesen, L. Arnberg, F. Mo, T. Weitkamp, A. Snigirev, Phys. Rev. Lett. 83, 5062 (1999)
• 6. O. Castelnau, T. Chauveau, M. Drakopoulos, A. Snigirev, I. Snigireva, C. Schroer, T. Ungar, Mater. Sci. Forumg 347-349, 297 (2000)
• 7. W. Ludwig, S. Schmidt, E.M. Lauridsen, H.F. Poulsen, J. Appl. Crystallographyg 41, 302 (2008)
• 8. G. Johnson, A. King, M.G. Honnicke, J. Marrow, W. Ludwig, J. Appl. Crystallographyg 41, 310 (2008)
• 9. K.M. Kemner, W. Yun, Z. Cai, B. Lai, H.-R. Lee, J. Maser, D.G. Legnini, W. Rodrigues, J.D. Jastrow, R.M. Miller, S.T. Pratt, J. Synchrotron Rad. 6, 639 (1999)
• 10. C.M. Hansel, S. Fendorf, S. Sutton, M. Newville, Environ. Sci. Technol. 35, 3863 (2001)
• 11. M.C. Camerani, A. Pinzani, A.S. Somogyi, S. Simionovici, B.-M. Ansell, O. Steenari, Lindqvist, Environ. Sci. Technol. 36, 3165 (2002)
• 12. D.H. McNear Jr., E. Peltier, J. Everhart, R.L. Chaney, S. Sutton, M. Newville, M. Rivers, D.L. Sparks, Environ. Sci. Technol. 39, 2210 (2005)
• 13. R. Terzano, M. Spagnuolo, L. Medici, B. Vekemans, L. Vincze, K. Janssens, P. Ruggiero, Environ. Sci. Technol. 39, 6280 (2005)
• 14. G. Silversmit, B. Vekemans, F.E. Brenker, S. Schmitz, M. Burghammer, C. Riekel, L. Vincze, Anal. Chem. 81, 6107 (2009)
• 15. H.H. Solak, Y. Vladimirsky, F. Cerrina, B. Lai, W. Yun, Z. Cai, P. Illinski, D. Legnini, W. Rodrigues, J. Appl. Phys. 86, 884 (1999)
• 16. T. Warwick, D. Attwood in: X-ray microscopy, AIP Conference Proceedings, Vol. 507, Ed. W. Meyer-Ilse, American Institute of Physics, Melville, New York 1999
• 17. in: Proceedings of the 8th International Conference on X-ray Microscopy, IPAP Conference Series, Vol. 7, Ed. Y. Kagoshima, IPAP, Tokyo 2006
• 18. C.G. Schroer, P. Cloetens, M. Rivers, A. Snigirev, A. Takeuchi, W. Yun, MRS Bulleting 29, 157 (2004)
• 19. A. Koch, C. Raven, P. Spanne, A. Snigirev, J. Opt. Soc. Am. A 15, 1940 (1998)
• 20. M. Stampanoni, G. Borchert, P. Wyss, R. Abela, B. Patterson, S. Hunt, D. Vermeulen, P. Rüegsegger, Nucl. Instrum. Meth. A 491, 291 (2002)
• 21. C. Raven, A. Snigirev, I. Snigireva, P. Spanne, S. Souvorov, V. Kohn, Appl. Phys. Lett. 69, 1826 (1996)
• 22. M. Salome, F. Peyrin, P. Cloetens, C. Odet, A.M. Laval-Jeantet, J. Baruchel, P. Spanne, Med. Phys. 26, 2194 (1999)
• 23. C.F. Martin, C. Josserond, L. Salvo, J.J. Blandin, P. Cloetens, E. Boller, Scripta Mater. 42, 375 (2000)
• 24. A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995)
• 25. T.E. Gureyev, C. Raven, A. Snigirev, I. Snigireva, S.W. Wilkins, J. Phys. D, Appl. Phys. 32, 563 (1999)
• 26. P. Spanne, C. Raven, I. Snigireva, A. Snigirev, Phys. Med. Biol. 44, 741 (1999)
• 27. P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J.P. Guigay, M. Schlenker, Appl. Phys. Lett. 75, 2912 (1999)
• 28. J.-Y. Buffière, E. Maire, P. Cloetens, G. Lormand, R. Fougères, Acta Mater. 47, 1613 (1999)
• 29. T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, E. Ziegler, Opt. Expressg 13, 6296 (2005)
• 30. F. Pfeiffer, O. Bunk, C. Grünzweig, C. David, M. Bech, G. Le Duc, A. Bravin, Phys. Med. Biol. 52, 6923 (2007)
• 31. S.A. McDonald, F. Marone, C. Hintermueller, G. Mikuljan, C. David, F. Pfeiffer, M. Stampanoni, Journal of Synchrotron Radiationg 16, 562 (2009)
• 32. S. Hannemann, J.-D. Grunwaldt, N. van Vegten, A. Baiker, P. Boye, C.G. Schroer, Catalysis Todayg 126, 54 (2006)
• 33. J.-D. Grunwaldt, B. Kimmerle, S. Hannemann, A. Baiker, P. Boye, C.G. Schroer, J. Mat. Chem. 17, 2603 (2007)
• 34. J.-D. Grunwaldt, B. Kimmerle, A. Baiker, P. Boye, C.G. Schroer, P. Glatzel, C.N. Borca, F. Beckmann, Catalysis Todayg 145, 267 (2009)
• 35. B. Kimmerle, P. Haider, J.-D. Grunwaldt, A. Baiker, P. Boye, C.G. Schroer, Appl. Catal. A, Gen. 353, 36 (2009)
• 36. C.G. Schroer, J.-D. Grunwaldt, Synchrotron Radiation Newsg 22, 23 (2009)
• 37. S. Lagomarsino, A. Cedola, P. Cloetens, S. Di, W. Fonzo, G. Jark, Soullié, C. Riekel, Appl. Phys. Lett. 71, 2557 (1997)
• 38. R. Mokso, P. Cloetens, E. Maire, W. Ludwig, J.-Y. Buffière, Appl. Phys. Lett. 90, 144104 (2007)
• 39. Y.S. Chu, J.M. Yi, F.D. Carlo, Q. Shen, W.-K. Lee, H.J. Wu, C.L. Wang, J.Y. Wang, C.J. Liu, C.H. Wang, S.R. Wu, C.C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K.S. Liang, C.S. Yang, J.H. Je, G. Margaritondo, Appl. Phys. Lett. 92, 103119 (2008)
• 40. B. Lengeler, C.G. Schroer, M. Richwin, J. Tümmler, M. Drakopoulos, A. Snigirev, I. Snigireva, Appl. Phys. Lett. 74, 3924 (1999)
• 41. C.G. Schroer, J. Meyer, M. Kuhlmann, B. Benner, T.F. Günzler, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev, I. Snigireva, Appl. Phys. Lett. 81, 1527 (2002)
• 42. C.G. Schroer, M. Kuhlmann, B. Lengeler, T.F. Günzler, O. Kurapova, B. Benner, C. Rau, A.S. Simionovici, A. Snigirev, I. Snigireva, in: Design and Microfabrication of Novel X-Ray Optics, Proceedings of the SPIE Vol. 4783, Ed. D.C. Mancini, SPIE, Bellingham 2002, p. 10
• 43. G.E. Ice, B.C. Larson, MRS Bulleting 29, 170 (2004)
• 44. O. Hignette, P. Cloetens, G. Rostaing, P. Bernard, C. Morawe, Rev. Sci. Instrum. 76, 063709 (2005)
• 45. B. Golosio, A. Somogyi, A. Simionovici, P. Bleuet, J. Susini, L. Lamelle, Appl. Phys. Lett. 84, 2199 (2004)
• 46. J.P. Hogan, R.A. Gonsalves, A.S. Krieger, IEEE Trans. Nucl. Sci. 38, 1721 (1991)
• 47. L. Vincze, K. Janssens, B. Vekemans, F. Adams, in: Developments in X-ray Tomography II, Proceedings of the SPIE Vol. 3772, Ed. U. Bonse, SPIE, Bellingham 1999, p. 328
• 48. C.G. Schroer, Appl. Phys. Lett. 79, 1912 (2001)
• 49. A. Brunetti, B. Golosio, Computer Physics Communicationsg 141, 412 (2001)
• 50. B. Golosio, A. Simionovici, A. Somogyi, L. Lamelle, M. Chukalina, A. Brunetti, J. Appl. Phys. 94, 145 (2003)
• 51. B. Vekemans, L. Vincze, F.E. Brenker, F. Adams, J. Anal. At. Spectrom. 19, 1302 (2004)
• 52. P.J. La, Rivière, D. Billmire, P. Vargas, M. Rivers, S.R. Sutton, Opt. Eng. 45, 077005 (2006)
• 53. C.G. Schroer, M. Kuhlmann, T.F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, E. Ziegler, A. Mashayekhi, D. Haeffner, J.-D. Grunwaldt, A. Baiker, Appl. Phys. Lett. 82, 3360 (2003)
• 54. C.G. Schroer, M. Kuhlmann, S.V. Roth, R. Gehrke, N. Stribeck, A. Almendarez-Camarillo, B. Lengeler, Appl. Phys. Lett. 88, 164102 (2006)
• 55. J.M. Feldkamp, M. Kuhlmann, S.V. Roth, A. Timmann, R. Gehrke, I. Shakhverdova, P. Paufler, S.K. Filatov, R.S. Bubnova, C.G. Schroer, Phys. Status Solidi A 206, 1723 (2009)
• 56. P. Bleuet, E. Welcomme, E. Dooryhée, J. Susini, J.-L. Hodeau, P. Walter, Nature Mater. 7, 468 (2008)
• 57. M. Kuhlmann, J.M. Feldkamp, J. Patommel, S.V. Roth, A. Timmann, R. Gehrke, P. Müller-Buschbaum, C.G. Schroer, Langmuir Lett. 25, 7241 (2009)
• 58. J.M. Feldkamp, C.G. Schroer, J. Patommel, B. Lengeler, T.F. Günzler, M. Schweitzer, C. Stenzel, M. Dieckmann, W.H. Schröder, Rev. Sci. Instrum. 78, 073702 (2007)
• 59. W. Chao, B.D. Harteneck, J.A. Liddle, E.H. Anderson, D.T. Attwood, Natureg 435, 1210 (2005)
• 60. H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, K. Yamauchi, Appl. Phys. Lett. 90, 051903 (2007)
• 61. G.-C. Yin, Y.-F. Song, M.-T. Tang, F.-R. Chen, K.S. Liang, F.W. Duewer, M. Feser, W. Yun, H.-P.D. Shieh, Appl. Phys. Lett. 89, 221122 (2006)
• 62. H.C. Kang, H. Yan, R.P. Winarski, M.V. Holt, J. Maser, C. Liu, R. Conley, S. Vogt, A.T. Macrander, G.B. Stephenson, Appl. Phys. Lett. 92, 221114 (2008)
• 63. R. Conley, C. Liu, J. Qian, C.M. Kewish, A.T. Macrander, H. Yan, H.C. Kang, J. Maser, G.B. Stephenson, Rev. Sci. Instrum. 79, 053104 (2008)
• 64. A. Jarre, C. Fuhse, C. Ollinger, J. Seeger, R. Tucoulou, T. Salditt, Phys. Rev. Lett. 94, 074801 (2005)
• 65. C.G. Schroer, O. Kurapova, J. Patommel, P. Boye, J. Feldkamp, B. Lengeler, M. Burghammer, C. Riekel, L. Vincze, A. van der Hart, M. Küchler, Appl. Phys. Lett. 87, 124103 (2005)
• 66. C. Bergemann, H. Keymeulen, J.F. van der Veen, Phys. Rev. Lett. 91, 204801 (2003)
• 67. C.G. Schroer, B. Lengeler, Phys. Rev. Lett. 94, 054802 (2005)
• 68. C.G. Schroer, Phys. Rev. B 74, 033405 (2006)
• 69. H. Yan, J. Maser, A. Macrander, Q. Shen, S. Vogt, G.B. Stephenson, H.C. Kang, Phys. Rev. B 76, 115438 (2007)
• 70. A. Snigirev, V. Kohn, I. Snigireva, B. Lengeler, Natureg 384, 49 (1996)
• 71. B. Lengeler, J. Tümmler, A. Snigirev, I. Snigireva, C. Raven, J. Appl. Phys. 84, 5855 (1998)
• 72. Y. Kohmura, M. Awaji, Y. Suzuki, T. Ishikawa, Y.I. Dudchik, N.N. Kolchewsky, F.F. Komarow, Rev. Sci. Instrum. 70, 4161 (1999)
• 73. J.T. Cremer, M.A. Piestrup, H.R. Beguiristain, C.K. Gary, R.H. Pantell, R. Tatchyn, Rev. Sci. Instrum. 70, 3545 (1999)
• 74. M.A. Piestrup, J.T. Cremer, H.R. Beguiristain, C.K. Gary, R.H. Pantell, Rev. Sci. Instrum. 71, 4375 (2000)
• 75. B. Cederström, R.N. Cahn, M. Danielsson, M. Lundqvist, D.R. Nygren, Natureg 404, 951 (2000)
• 76. V. Aristov, M. Grigoriev, S. Kuznetsov, L. Shabelnikov, V. Yunkin, T. Weitkamp, C. Rau, I. Snigireva, A. Snigirev, M. Hoffmann, E. Voges, Appl. Phys. Lett. 77, 4058 (2000)
• 77. E.M. Dufresne, D.A. Arms, R. Clarke, N.R. Pereira, S.B. Dierker, D. Foster, Appl. Phys. Lett. 79, 4085 (2001)
• 78. H.R. Beguiristain, J.T. Cremer, M.A. Piestrup, C.K. Gary, R.H. Pantell, Opt. Lett. 27, 778 (2002)
• 79. K. Evans-Lutterodt, J.M. Ablett, A. Stein, C.-C. Kao, D.M. Tennant, F. Klemens, A. Taylor, C. Jacobsen, P.L. Gammel, H. Huggins, S. Ustin, G. Bogart, L. Ocula, Optics Expressg 11, 919 (2003)
• 80. B. Lengeler, C.G. Schroer, M. Kuhlmann, B. Benner, T.F. Günzler, O. Kurapova, F. Zontone, A. Snigirev, I. Snigireva, J. Phys. D, Appl. Phys. 38, A218 (2005)
• 81. B. Nöhammer, J. Hoszowska, A.K. Freund, C. David, J. Synchrotron Rad. 10, 168 (2003)
• 82. B. Lengeler, C. Schroer, J. Tümmler, B. Benner, M. Richwin, A. Snigirev, I. Snigireva, M. Drakopoulos, J. Synchrotron Rad. 6, 1153 (1999)
• 83. C.G. Schroer, B. Benner, T.F. Günzler, M. Kuhlmann, C. Zimprich, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev, I. Snigireva, J. Appenzeller, Rev. Sci. Instrum. 73, 1640 (2002)
• 84. C.G. Schroer, B. Lengeler, B. Benner, T.F. Günzler, M. Kuhlmann, A.S. Simionovici, S. Bohic, M. Drakopoulos, A. Snigirev, I. Snigireva, W.H. Schröder, Proc. SPIE 4499, 52 (2001)
• 85. S.V. Roth, R. Döhrmann, M. Dommach, M. Kuhlmann, I. Kröger, R. Gehrke, H. Walter, C. Schroer, B. Lengeler, P. Müller-Buschbaum, Rev. Sci. Instrum. 77, 085106 (2006)
• 86. C.G. Schroer, M. Kuhlmann, U.T. Hunger, T.F. Günzler, O. Kurapova, S. Feste, F. Frehse, B. Lengeler, M. Drakopoulos, A. Somogyi, A.S. Simionovici, A. Snigirev, I. Snigireva, C. Schug, W.H. Schröder, Appl. Phys. Lett. 82, 1485 (2003)
• 87. A.C. Kak, M. Slaney, Principles of Computerized Tomographic Imaging, IEEE Press, New York 1988
• 88. A.S. Simionovici, M. Chukalina, C. Schroer, M. Drakopoulos, A. Snigirev, I. Snigireva, B. Lengeler, K. Janssens, F. Adams, IEEE Trans. Nucl. Sci. 47, 2736 (2000)
• 89. C.G. Schroer, J. Tümmler, T.F. Günzler, B. Lengeler, W.H. Schröder, A.J. Kuhn, A.S. Simionovici, A. Snigirev, I. Snigireva, Proc. SPIE 4142, 287 (2000)
• 90. M. Richwin, R. Zaeper, D. Lützenkirchen-Hecht, R. Frahm, J. Synchrotron Rad. 8, 354 (2001)
• 91. R. Frahm, J. Stötzel, D. Lützenkirchen-Hecht, Synchrotron Radiation Newsg 22, 6 (2009)
• 92. C.G. Schroer, M. Kuhlmann, T.F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, A. Mashayekhi, D. Haeffner, E. Ziegler, J.-D. Grunwaldt, A. Baiker, Physica Scripta T 115, 1026 (2005)
• 93. J. Miao, P. Charalambous, J. Kirz, D. Sayre, Natureg 400, 342 (1999)
• 94. I.K. Robinson, I.A. Vartanyants, G.J. Williams, M.A. Pfeifer, J.A. Pitney, Phys. Rev. Lett. 87, 195505 (2001)
• 95. J. Miao, T. Ishikawa, B. Johnson, E.H. Anderson, B. Lai, K.O. Hodgson, Phys. Rev. Lett. 89, 088303 (2002)
• 96. G.J. Williams, M.A. Pfeifer, I.A. Vartanyants, I.K. Robinson, Phys. Rev. Lett. 90, 175501 (2003)
• 97. D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. Neiman, D. Sayre, P. Natl. Acad. Sci. USAg 102, 15343 (2005)
• 98. J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S.H. Risbud, T. Ishikawa, Phys. Rev. Lett. 95, 085503 (2005)
• 99. H.N. Chapman, A. Barty, S. Marchesini, A. Noy, S.P. Hau-Riege, C. Cui, M.R. Howells, R. Rosen, H. He, J.C.H. Spence, U. Weierstall, T. Beetz, C. Jacobsen, D. Shapiro, J. Opt. Soc. Am. A 23, 1179 (2006)
• 100. M.A. Pfeifer, G.J. Williams, I.A. Vartanyants, R. Harder, I.K. Robinson, Natureg 442, 63 (2006)
• 101. J.R. Fienup, Appl. Opt. 21, 2758 (1982)
• 102. R. Neutze, R. Wouts, D. van der Spoel, E. Weckert, J. Hajdu, Natureg 406, 752 (2000)
• 103. J. Miao, K.O. Hodgson, D. Sayre, Proc. Natl. Acad. Sci. USAg 98, 6641 (2001)
• 104. D. Starodub, P. Rez, G. Hembree, M.R. Howells, D.A. Shapiro, H.N. Chapman, P. Fromme, K. Schmidt, U. Weierstall, R.B. Doak, J.C.H. Spence, J. Synchrotron Rad. 15, 62 (2007)
• 105. M.R. Howells, T. Beetz, H.N. Chapman, C. Cui, J.M. Holton, C.J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D.A. Shapiro, J.C.H. Spence, D. Starodub, J. Electron Spect. 170, 4 (2009)
• 106. C.G. Schroer, P. Boye, J. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, C. Riekel, Phys. Rev. Lett. 101, 090801 (2008)
• 107. S. Marchesini, H. He, H.N. Chapman, S.P. Hau-Riege, A. Noy, M.R. Howells, U. Weierstall, J.C.H. Spence, Phys. Rev. B 68, 140101(R) (2003)
• 108. J.M. Rodenburg, H.M.L. Faulkner, Appl. Phys. Lett. 85, 4795 (2004)
• 109. H.M.L. Faulkner, J.M. Rodenburg, Phys. Rev. Lett. 93, 023903 (2004)
• 110. J.M. Rodenburg, A.C. Hurst, A.G. Cullis, B.R. Dobsen, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, I. Johnson, Phys. Rev. Lett. 98, 034801 (2007)
• 111. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, F. Pfeiffer, Scienceg 321, 379 (2008)
• 112. K. Balewski, W. Brefeld, W. Decking, H. Franz, R. Röhlsberger, E. Weckert, PETRA III: A Low Emittance Synchrotron Radiation Source, DESY 2004-035, DESY, Hamburg 2004
• 113. G. Falkenberg, N. Reimers, C.G. Schroer, in: HASYLAB Jahresbericht, DESY, Hamburg 2007, p. 185
• 114. C.G. Schroer, P. Boye, J.M. Feldkamp, J. Patommel, D. Samberg, A. Schropp, A. Schwab, S. Stephan, G. Falkenberg, G. Wellenreuther, N. Reimers, Nucl. Instrum Methods A (2009), Doi: 10.1016/j.nima.2009.10.094

Identifiers

DOI

10.12693/APhysPolA.117.357