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2010 | 117 | 2 | 357-368
Article title

Hard X-ray Microscopy with Elemental, Chemical and Structural Contrast

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Abstracts
EN
We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.
Keywords
EN
Publisher

Year
Volume
117
Issue
2
Pages
357-368
Physical description
Dates
published
2010-02
Contributors
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
author
  • ESRF, B.P. 220, F-38043 Grenoble, France
author
  • ESRF, B.P. 220, F-38043 Grenoble, France
author
  • ESRF, B.P. 220, F-38043 Grenoble, France
author
  • II. Physikalisches Institut, RWTH Aachen University, D-52056 Aachen, Germany
author
  • HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany
  • HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany
author
  • CELLS HALBA, Cerdanyola del Vallès, Barcelona, Spain
author
  • Institute of Materials Science and Department of Physics, Bergische Universität Wuppertal, 20 Gauss Str. 20, D-42097 Wuppertal, Germany
  • Institute of Materials Science and Department of Physics, Bergische Universität Wuppertal, 20 Gauss Str. 20, D-42097 Wuppertal, Germany
author
  • ICG-3, Forschungszentrum Jülich, Germany Jülich GmbH, 52425 Jülich Germany
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