X-ray Topographic Investigations of Domain Structure in Czochralski Grown Pr_{x}La_{1-x}AlO_{3} Crystals

• Authors: K. Wieteska , W. Wierzchowski , A. Malinowska , S. Turczyński , M. Lefeld-Sosnowska , D. Pawlak , T. Łukasiewicz , W. Graeff
• Languages of publication: EN

Abstracts

EN

In the present paper X-ray diffraction topographic techniques were applied to a number of samples cut from Czochralski grown Pr_{x}La_{1-x}AlO_{3} crystals with different ratio of praseodymium and lanthanum. Conventional and synchrotron X-ray topographic investigations revealed differently developed domain structures dependent on the composition of mixed praseodymium lanthanum aluminium perovskites. Some large mosaic blocks were observed together with the domains. In the best crystals, X-ray topographs revealed striation fringes and individual dislocations inside large domains. Synchrotron topographs allowed us to indicate that the domains correspond to three different crystallographic planes, and to evaluate the lattice misorientation between domains in the range of 20-50 arc min.

Keywords

EN

81.05.-t; 81.10.Dn; 61.72.Ff

Discipline

• 81.10.Dn: Growth from solutions
• 81.05.-t: Specific materials: fabrication, treatment, testing, and analysis(for superconducting materials, see 74.70.-b, and 74.72.-h; for magnetic materials, see 75.50.-y; for optical materials, see 42.70.-a; for dielectric materials, see 77.84.-s; for disperse systems and complex fluids, see 82.70.-y; see also 82.75.-z Molecular sieves, zeolites, clathrates, and other complex solids; for materials properties, see sections 60 and 70)
• 61.72.Ff: Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 117
• Issue: 2
• Pages: 268-271

Dates

published

2010-02

Contributors

author

K. Wieteska

• Institute of Atomic Energy POLATOM, 05-400 Otwock-Świerk, Poland

author

W. Wierzchowski

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

A. Malinowska

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

S. Turczyński

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

M. Lefeld-Sosnowska

• Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland

author

D. Pawlak

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

T. Łukasiewicz

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

W. Graeff

• HASYLAB at DESY, Notkestr. 85, 22-603 Hamburg, Germany

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Identifiers

DOI

10.12693/APhysPolA.117.268