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2009 | 116 | S | S-192-S-193

Article title

Non-Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors with a High Resolution and High Contrast Micro XCT System

Authors

Content

Title variants

Languages of publication

EN

Abstracts

Keywords

Year

Volume

116

Issue

S

Pages

S-192-S-193

Physical description

Dates

published
2009-12

Contributors

author
  • Xradia, Inc., Concord, CA 94520, USA
author
  • LOT-Oriel, 41-710, Ruda Śląska, Poland

References

  • 1. S.H. Lau, H. Chang, J. Cheong, F. Duewer, M. Feser, A. Tkachuk, W. Yun, in: Proc. 25th Army Science Conf., 2006, Orlando (Fl), USA
  • 2. S.H. Lau, A. Tkachuk, M. Feser, H. Cui, F. Duewer, W. Yun, in: Proc. LSIT, Osaka (Japan) 2009, Senri Life Science Center, Toyonaka 2009

Document Type

Publication order reference

YADDA identifier

bwmeta1.element.bwnjournal-article-appv116ns55kz
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