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2009 | 116 | S | S-192-S-193
Article title

Non-Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors with a High Resolution and High Contrast Micro XCT System

Authors
Content
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Languages of publication
EN
Abstracts
Keywords
Publisher

Year
Volume
116
Issue
S
Pages
S-192-S-193
Physical description
Dates
published
2009-12
Contributors
author
  • Xradia, Inc., Concord, CA 94520, USA
author
  • LOT-Oriel, 41-710, Ruda Śląska, Poland
References
  • 1. S.H. Lau, H. Chang, J. Cheong, F. Duewer, M. Feser, A. Tkachuk, W. Yun, in: Proc. 25th Army Science Conf., 2006, Orlando (Fl), USA
  • 2. S.H. Lau, A. Tkachuk, M. Feser, H. Cui, F. Duewer, W. Yun, in: Proc. LSIT, Osaka (Japan) 2009, Senri Life Science Center, Toyonaka 2009
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv116ns55kz
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