Measurements of Surface Properties in the Nano- and Microscale Using Optical, Mechanical, and Scanning Probe Methods

• Authors: Ł. Rok
• Languages of publication: EN
• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 116
• Issue: S
• Pages: S-180-S-183

Dates

published

2009-12

Contributors

author

Ł. Rok

• Schaefer Technologie GmbH, Robert-Bosch-Str. 31, 63225 Langen, Germany

References

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Identifiers

DOI

10.12693/APhysPolA.116.S-180