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2009 | 116 | S | S-180-S-183
Article title

Measurements of Surface Properties in the Nano- and Microscale Using Optical, Mechanical, and Scanning Probe Methods

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EN
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Publisher

Year
Volume
116
Issue
S
Pages
S-180-S-183
Physical description
Dates
published
2009-12
Contributors
author
  • Schaefer Technologie GmbH, Robert-Bosch-Str. 31, 63225 Langen, Germany
References
  • 1.G. Binnig, C. Quate, Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
  • 2. For more information see Park System application notes
  • 3. Nanosurf application note
  • 4. M. Wolfke, Phys. Zeits. 21, 495 (1920)
  • 5. D. Gabor, Nature (London) 161, 777 (1948)
  • 6. D. Gabor, Proc. R. Soc. A 197, 454 (1949)
  • 7. E. Cuche, F. Bevilacqua, Ch. Depeursinge, Opt. Lett. 24, 291 (1999)
  • 8. DHM stroboscopic module application brochure
  • 9. Sensofar application note
  • 10. Picture taken from Fogale brochure
  • 11. Liu Cui, Li Guoqing, Chen Wenwu, Mu Zongxin, Zhang Chengwu, Wang Liang, Thin Solid Films 475, 279 (2005)
  • 12. D.T. Wan, Y.C. Zhou, Y.W. Bao, C.K. Yan, Ceram. Int. 32, 883 (2006)
  • 13. N. Satyanarayana, S.K. Sinha, J. Phys. D, Appl. Phys. 38, 3512 (2005)
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv116ns51kz
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