Title variants
Languages of publication
Abstracts
In this article we present the method of determining the tip-sample distance using advanced data processing of scanning field's optical picture. This feature can reduce both: the approach process time and the risk of damaging the tip or the sample. Experimental results will be also presented.
Discipline
- 07.05.Pj: Image processing(see also 42.30.Va in optics; 87.57.-s Medical imaging in biological and medical physics; 95.75.Tv Digitization techniques in astronomy)
- 07.79.-v: Scanning probe microscopes and components(see also 68.37.-d Microscopy of surfaces, interfaces, and thin films)
- 06.60.Sx: Positioning and alignment; manipulating, remote handling
Journal
Year
Volume
Issue
Pages
S-99-S-101
Physical description
Dates
published
2009-12
Contributors
author
- Electrotechnical Institute, Division of Electrotechnology and Materials Science, M. Skłodowskiej-Curie 55/61, 50-369 Wrocław, Poland
author
- Faculty of Microsystems Electronics and Photonics, Wrocław University of Technology, Z. Janiszewskiego 11/17, 50-372 Wrocław, Poland
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv116ns26kz