Utilization of Digital Processing of the Optical Scanning Field View for Tip-Sample Distance Estimation during the Approach Procedure

• Authors: A. Sikora , Ł. Bednarz
• Languages of publication: EN

Abstracts

EN

In this article we present the method of determining the tip-sample distance using advanced data processing of scanning field's optical picture. This feature can reduce both: the approach process time and the risk of damaging the tip or the sample. Experimental results will be also presented.

Keywords

EN

06.60.Sx   07.05.Pj   07.79.-v  

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 116
• Issue: S
• Pages: S-99-S-101

Dates

published

2009-12

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Identifiers

DOI

10.12693/APhysPolA.116.S-99