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2009 | 116 | 5 | 944-946
Article title

Electrical Characterization of Defects in Schottky Au-CdTe:Ga Diodes

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EN
Abstracts
EN
Deep electron states in gallium doped CdTe have been studied by deep-level transient spectroscopy method. The Schottky Au-CdTe diodes were processed to perform the investigations. Rectifying properties of diodes have been examined by the room temperature current-voltage and capacitance-voltage measurements. Deep-level transient spectroscopy measurements performed in the range of temperatures 77-350 K yield the presence of three electron traps. The thermal activation energies and apparent capture cross-sections have been determined from related Arrhenius plots. The dominant trap of activation energy E_2 = 0.33 eV and capture cross-section σ_2 = 3 × 10^{-15} cm^2 has been assigned to the gallium related DX center present in the CdTe material.
Keywords
EN
Contributors
author
  • Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańkiego 27, 50-370 Wrocław, Poland
  • Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańkiego 27, 50-370 Wrocław, Poland
author
  • Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańkiego 27, 50-370 Wrocław, Poland
author
  • Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańkiego 27, 50-370 Wrocław, Poland
author
  • Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańkiego 27, 50-370 Wrocław, Poland
References
  • 1. E. Płaczek-Popko, J. Szatkowski, P. Becla, J. Appl. Phys. 95, 1171 (2004)
  • 2. C.H. Park, D.J. Chadi, Phys. Rev. B 52, 11884 (1995)
  • 3. E. Płaczek-Popko, Z. Gumienny, J. Trzmiel, J. Szatkowski, Opt. Appl. 38, 559 (2008)
  • 4. J. Trzmiel, E. Płaczek-Popko, K. Weron, J. Szatkowski, E. Wojtyna, Acta Phys. Pol. A 114, 1417 (2008)
  • 5. E.H. Rhoderic, R.H. Wiliams, Metal Semiconductor Contact, 2nd ed., Clarendon, Oxford 1988
  • 6. S.M. Sze, Kwok K. Ng, Physics of Semiconductor Devices, 3rd ed., Wiley, Hoboken, New Jersey 2007
  • 7. P. Blood, J.W. Orton, The Electrical Characterization of Semiconductors: Majority Carriers and Electron States, Academic Press, 1992
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv116n558kz
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