Cavity Enhanced Absorption Spectroscopy Sensor

• Authors: M. Nowakowski , J. Wojtas , Z. Bielecki , J. Mikołajczyk
• Languages of publication: EN

Abstracts

EN

The paper presents opportunities of cavity enhanced absorption spectroscopy technique application in nitrogen oxides (NO_{x}) detection. In this method the concentration of an absorbing gas is determined by measure of decay time of the light pulse trapped in an optical cavity. The measurements are not sensitive to fluctuation of both laser power and photodetector sensitivity. The cavity enhanced absorption spectroscopy technique is a modification of cavity ring down spectroscopy technique where the off-axis adjustment of the resonator is used. NO_{x} detection is carried out in the visible and infrared range. The signal is registered with a developed low noise photoreceiver. Features of the presented sensor show that it is possible to build a portable trace gases sensor. Its sensitivity could be comparable with chemical detectors. Such a system has several advantages: relatively low price, small size and weight, and detection possibility of other gases.

Keywords

EN

07.50.Qx; 42.79.Sz; 43.60.-c; 07.07.Df

Discipline

• 07.50.Qx: Signal processing electronics(see also 84.40.Ua in radiowave and microwave technology; 87.85.Ng Biological signal processing in biomedical engineering)
• 07.07.Df: Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
• 42.79.Sz: Optical communication systems, multiplexers, and demultiplexers(for fiber networks, see 42.81.Uv)

• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 116
• Issue: 3
• Pages: 363-367

Dates

published

2009-09

Contributors

author

M. Nowakowski

• Institute of Optoelectronics at Military University of Technology, S. Kaliskiego 2, 00-908 Warszawa, Poland

author

J. Wojtas

• Institute of Optoelectronics at Military University of Technology, S. Kaliskiego 2, 00-908 Warszawa, Poland

author

Z. Bielecki

• Institute of Optoelectronics at Military University of Technology, S. Kaliskiego 2, 00-908 Warszawa, Poland

author

J. Mikołajczyk

• Institute of Optoelectronics at Military University of Technology, S. Kaliskiego 2, 00-908 Warszawa, Poland

References

• 1. A. O'Keefe, D.A. Deacon, Rev. Sci. Instrum. 59, 2544 (1988)
• 2. R. Engeln, G. Berden, R. Peeters, G. Meijer, Rev. Sci. Instrum. 69, 3763 (1998)
• 3. V.L. Kasyutich, C.E. Canosa-Mas, C. Pfrang, S. Vaughan, R.P. Wayne, Appl. Phys. B 75, 755 (2002)
• 4. M.F. Merienne, A. Jenouvrier, B. Coquart, J. Atmos. Chem. 20, 281 (1995)
• 5. J. Wojtas, A. Czyżewski, T. Stacewicz, Z. Bielecki, Opt. Appl. 36, 461 (2006)
• 6. J. Wojtas, Z. Bielecki, Opto-Electron. Rev. 16, 44 (2008)
• 7. Z. Bielecki, W. Kołosowski, G. Różański, J. Wojtas, Computational Methods and Experimental Measurements, WIT Press, Southampton 2007, p. 809
• 8. W.J. Marinelli, D.M. Svanson, H.S. Johnson, J. Chem. Phys. 76, 2864 (1982)
• 9. A. Szpakowski, C. Tyszkiewicz, T. Pustelny, Acta Phys. Pol. A 114, A-237 (2008)
• 10. T. Pustelny, I. Zielonka, C. Tyszkiewicz, P. Karasinski, B. Pustelna, Opto-Electron. Rev. 46, 221 (2006)
• 11. http://www.epa.gov/ttn/emc/ftir/aedcdat1.html

Identifiers

DOI

10.12693/APhysPolA.116.363