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2009 | 116 | 1 | 72-74
Article title

Micro-Raman Study of BiFeO_3 Thin Films Fabricated by Chemical Solution Deposition Using Different Bi/Fe Ratio Precursors

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EN
Abstracts
EN
BiFeO_3 thin films were grown by chemical solution deposition using precursors with different elemental ratios, Bi/Fe = 1.1/1.0, 1.0/1.0 and 1.0/1.1. All the samples consisted of two easily distinguishable components of crystalline and amorphous phases. We have found that the electric properties of BiFeO_3 thin films are closely connected to the crystallinity of the films.
Keywords
EN
Contributors
author
  • Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan
author
  • Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan
author
  • Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan
author
  • Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan
author
  • Institute for Chemical Research, Kyoto University, Kyoto 611-0011, Japan
author
  • Department of Physics, Wakayama University, Wakayama 640-8510, Japan
author
  • Graduate School of Engineering Science, Osaka University, Osaka 560-8531, Japan
author
  • Graduate School of Engineering Science, Osaka University, Osaka 560-8531, Japan
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv116n115kz
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