The Design Aspects for Ultra Low-Power, Low-Noise 90 nm CMOS Charge Sensitive Amplifier for the Active Pixel Detector

• Authors: V. Barzdenas , R. Navickas
• Languages of publication: EN

Abstracts

EN

A falling particle in the digital registration systems for elementary particles active pixel detector induces electric charge, the value of which describes the parameters of the particle in the detector. Since the electric charge induced by a single particle is relatively weak, the detector signal is first processed (amplified and shaped) right in the zone of irradiation and only then transmitted further. This paper analyses the primary analogical registration electronics for digital registration systems for elementary particles active pixel detectors, which is charge sensitive amplifiers operating in the nanoampere region.

Keywords

EN

84.37.+q; 07.77.Ka

Discipline

• 84.37.+q: Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)
• 07.77.Ka: Charged-particle beam sources and detectors(see also 29.40.-n Radiation detectors in nuclear physics)

• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 115
• Issue: 6
• Pages: 1139-1140

Dates

published

2009-06

Contributors

author

V. Barzdenas

• Computer Engineering Department, Electronics Faculty, Vilnius Gediminas Technical University, Naugarduko Str. 41-447, LT-03227 Vilnius, Lithuania

author

R. Navickas

• Computer Engineering Department, Electronics Faculty, Vilnius Gediminas Technical University, Naugarduko Str. 41-447, LT-03227 Vilnius, Lithuania

References

• 1. G. Batignani, S. Bettarini, F. Bosi, Nucl. Phys. B (Proc. Suppl.) 172, 20 (2007)
• 2. V. Barzdėnas, R. Navickas, Solid State Phenom. Mechatronic Syst. Mater. MSM 2005 113, 453 (2006)
• 3. V. Barzdėnas, R. Navickas, Acta Phys. Pol. A 113, 825 (2008)
• 4. MOSIS, Integrated Circuits Fabrication Service: http://www.mosis.org

Identifiers

DOI

10.12693/APhysPolA.115.1139