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2009 | 115 | 1 | 355-356
Article title

Interface Mixing in Fe/Si Multilayers Observed by the In Situ Conductance Measurements

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EN
Abstracts
EN
In this contribution the in situ conductance vs. deposition time dependences of Fe/Si multilayers are analysed. The plot of resistance multiplied by the square of the thickness as a function of iron thickness shows that during the iron deposition initially amorphous-like Fe-Si mixture is formed, next the mixture crystallises, and finally bcc-Fe phase appears. The interface mixing is also manifested by the reduction of the total multilayer thickness measured by small angle X-ray diffraction.
Keywords
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Contributors
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
References
  • 1. T. Luciński, P. Wandziuk, F. Stobiecki, B. Andrzejewski, M. Kopcewicz, A. Hütten, G. Reiss, W. Szuszkiewicz, J. Magn. Magn. Mater. 282, 248 (2004)
  • 2. T. Luciński, P. Wandziuk, B. Szymański, J. Baszyński, F. Stobiecki, J. Zweck, Phys. Status Solidi C 3, 93 (2006)
  • 3. P. Chomiuk, M. Wróblewski, M. Błaszyk, T. Luciński, B. Susła, Acta Phys. Pol. A 113, 657 (2008)
  • 4. C. Dufour, A. Bruson, G. Marchal, B. George, Ph. Mangin, J. Magn. Magn. Mater. 93, 545 (1991)
  • 5. Ph. Mangin, G. Marchal, B. Rodmacq, Chr. Janot, Philos. Mag. 36, 643 (1977)
  • 6. T. Luciński, M. Kopcewicz, A. Hütten, H. Brückl, S. Heitmann, T. Hempel, G. Reiss, J. Appl. Phys. 93, 6501 (2006)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv115n1102kz
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