Fabrication and Characterization of Hybrid Tunnel Magnetoresistance Structures with Embedded Self-Assembled Nanoparticle Templates

• Authors: P. Siffalovic , E. Majkova , L. Chitu , Y. Halahovets , M. Jergel , R. Senderak , S. Luby , M. Weis , A. Satka , B. Szymański , F. Stobiecki , A. Timmann , S. Roth
• Languages of publication: EN

Abstracts

EN

We report on an incorporation of self-assembled templates of superparamagnetic Fe-O nanoparticles into tunnel magnetoresistance devices. We fabricated a multilayer stack composed of the following layer sequence: Cr/Au/Co/NP/Co/Cu on Si(100) substrate where NP stands for a self-assembled layer of nanoparticles deposited by the Langmuir-Blodgett technique. The X-ray reflectivity and grazing-incidence small angle X-ray scattering were employed to study the layers thicknesses and interface morphology in each preparation step. In particular, the grazing-incidence small angle X-ray scattering was measured before and after the nanoparticle incorporation as well as on the complete tunnel magnetoresistance stack. In this way, in-depth morphology profile during subsequent preparation steps was obtained. We demonstrate that X-ray analysis of the deposited tunnel magnetoresistance stack is essential for successful fabrication of novel hybrid devices consisting of self-assembled nanoparticles.

Keywords

EN

61.05.cf; 61.46.Df

Discipline

• 61.46.Df: Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)
• 61.05.cf: X-ray scattering (including small-angle scattering)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 115
• Issue: 1
• Pages: 332-335

Dates

published

2009-01

Contributors

author

P. Siffalovic

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

E. Majkova

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

L. Chitu

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

Y. Halahovets

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

M. Jergel

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

R. Senderak

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

S. Luby

• Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511 Bratislava, Slovakia

author

M. Weis

• Department of Physics, Slovak Technical University, Ilkovicova 3, 81219 Bratislava, Slovakia

author

A. Satka

• International Laser Center, Ilkovicova 3, 81219 Bratislava, Slovakia

author

B. Szymański

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

F. Stobiecki

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

A. Timmann

• HASYLAB/DESY, Notkestr. 86, 22603 Hamburg, Germany

author

S. Roth

• HASYLAB/DESY, Notkestr. 86, 22603 Hamburg, Germany

References

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• 2. P. Siffalovic, E. Majkova, L. Chitu, M. Jergel, S. Luby, A. Satka, S.V. Roth, Phys. Rev. B 76, 195432 (2007)
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• 6. S.V. Roth, R. Döhrmann, M. Dommach, M. Kuhlmann, I. Kröger, R. Gehrke, H. Walter, C. Schroer, B. Lengeler, P. Müller-Buschbaum, Rev. Sci. Instrum. 77, 085106 (2006)
• 7. V. Holý, U. Pietsch, T. Baumbach, High-Resolution X-Ray Scattering from the Thin Films and Multilayers, Springer, Berlin 1999

Identifiers

DOI

10.12693/APhysPolA.115.332