Electronic Structure of Y_{3}Al_{5}O_{12}:V Single Crystals, Comparison with Sintered Ceramics

• Authors: M. Kruczek , E. Talik , J. Kusz , H. Sakowska , M. Świrkowicz , H. Węglarz
• Languages of publication: EN

Abstracts

EN

Y_{3}Al_{5}O_{12} (YAG) single crystals doped with vanadium ions (V^{3+}) were obtained by the Czochralski method. The X-ray photoelectron spectra of YAG:V annealed in reducing atmospheres: H_{2}, vacuum and H_{2} + vacuum are presented and compared with the spectra of the YAG ceramics. The X-ray photoelectron spectra showed that the vanadium dopant concentration in YAG:V crystals is lower than a nominal one. For the "as grown" YAG:2.8at.%V crystal vanadium exists in the mixed valence state. The increase in lattice parameters for the samples annealed in hydrogen was found.

Keywords

EN

33.60.+q; 33.70.Jg; 79.60.-i; 79.60.Bm

Discipline

• 79.60.-i: Photoemission and photoelectron spectra(for photoelectron spectroscopy, see 87.64.ks in biological physics; 82.80.Pv in chemical analysis)
• 33.60.+q: Photoelectron spectra(for biophysical applications, see 87.64.ks)
• 79.60.Bm: Clean metal, semiconductor, and insulator surfaces
• 33.70.Jg: Line and band widths, shapes, and shifts

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2009
• Volume: 115
• Issue: 1
• Pages: 209-212

Dates

published

2009-01

Contributors

author

M. Kruczek

• Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland
• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

E. Talik

• Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland

author

J. Kusz

• Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland

author

H. Sakowska

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

M. Świrkowicz

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

H. Węglarz

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

References

• 1. Z. Mierczyk, Z. Frukacz, Opto-Electron. Rev. 1, 67 (2000)
• 2. K. Ueda, J. Lu, Laser Phys. 11, 1053 (2001)
• 3. J. Moulder, W. Stickle, P. Sobol, K. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics, Minnesota 1995
• 4. Multipak Software Version 6, Physical Electronics, Minnesota 1998
• 5. M. Kruczek, E. Talik, H. Sakowska, M. Gała, M. Świrkowicz, Cryst. Res. Technol. 40, 439 (2005)
• 6. S.N. Ruddlesden, P. Popper, Acta Crystallogr. 11, 54 (1958)

Identifiers

DOI

10.12693/APhysPolA.115.209