Resonant Photoemission Study οf 4f Electrons on the Surface οf Semiconductors

• Authors: B. Orłowski , B. Kowalski , M. Pietrzyk , R. Buczko
• Languages of publication: EN

Abstracts

EN

The contribution of 4f electrons to the electronic structure of the semiconductor clean surface caused by the surface doping of it by rare-earth metal atoms (Eu, Sm) will be presented. The surface doping was performed by the controlled, sequential deposition of the rare-earth metal atoms on the clean surface in UHV conditions (Sm on GaN or CdTe) or by the doping of the layer volume of (EuGd)Te. After each deposition or surface treatment the synchrotron radiation was used to measure in situ the resonant photoemission spectra (the Fano type resonance) to study the contribution of 4f electrons of divalent and trivalent Sm and Eu ions to the valence band electronic structure of created sample. The first stages of the metal atoms deposition lead to the surface doping. Further metal atoms deposition leads to the growth of the metallic islands on the surface and causes the appearance of the sharp metallic Fermi edge in the energy distribution curves. Proper coverage and annealing of the sample surface with metal atoms leads to the diffusion of the metal atoms into the sample and results in an increase in the crystal doping and decrease in the metallic islands contribution to the measured spectra. As a result, the new electronic structure of the valence band can be created and investigated in situ.

Keywords

EN

79.60.Bm; 71.20.Mq; 07.85.-m

Discipline

• 07.85.-m: X- and γ-ray instruments(for x- and γ-ray telescopes, see 95.55.Ka in astronomy; for x-ray beams and x-ray optics, see 41.50.+h)
• 71.20.Mq: Elemental semiconductors
• 79.60.Bm: Clean metal, semiconductor, and insulator surfaces

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2008
• Volume: 114
• Issue: S
• Pages: S-103-S-114

Dates

published

2008-12

Contributors

author

B. Orłowski

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

B. Kowalski

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

M. Pietrzyk

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

author

R. Buczko

• Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

References

• 1. D.E. Estman, Y. Farge, Handbook of Synchrotron Radiation, Vols. 1-4, North-Holland, Amsterdam 1983-1991
• 2. Introduction to Synchrotron Radiation, Ed. G. Margaritondo, Oxford University Press, New York 1988
• 3. Application of Synchrotron Radiation, Eds. C.R.A. Catlow, G.N. Greaves, Blackie, London 1990
• 4. L. Ley, M. Cardona, Photoemission in Solids I and II, Topics in Applied Physics, Vols. 26/27, Springer, Berlin 1979
• 5. Photoelectron Spectroscopy, Ed. M. Cardona, Springer Series in Solid-State Science, Vol. 82, Springer, Berlin 1996
• 6. Physical methods of research in biology, medicine and environment protection, Eds. A.Z. Hrynkiewicz, E. Rokita, Wydawnictwo Naukowe PWN, Warszawa 1999 (in Polish)
• 7. B.A. Orlowski, B.J. Kowalski, E. Guziewicz, K. Szamota-Sadowska, N. Barrett, C. Guillot, R.L. Johnson, J. Ghijsen, Prog. Surf. Sci. 67, 323 (2001)
• 8. U. Fano, Phys. Rev. 124, 1866 (1961)
• 9. B. Sonntag, P. Zimmerman, Rep. Prog. Phys. 55, 911 (1992)
• 10. L.C. Devis, Phys. Rev. B 25, 2912 (1989); R.J. Lad, V.E. Henrich, Phys. Rev. B 39, 13478 (1989)
• 11. L. Ley, M. Taniguchi, J. Ghijsen, R.L. Johnson, A. Fujimori, Phys. Rev. B 35, 2839 (1987)
• 12. M. Taniguchi, Y. Ueda, I. Morisda, Y. Muashita, T. Ohita, I. Souma, Y. Oka, Phys. Rev. B 41, 3069 (1990)
• 13. B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.P. Lacharme, C.A. Sebenne, Appl. Surf. Sci. 123/124, 631 (1998)
• 14. E. Guziewicz, B.J. Kowalski, K. Szamota-Sadowska, B.A. Orlowski, J. Masek, R.L. Johnson, J. Alloys Comp. 286, 137 (1999)
• 15. E. Guziewicz, B.J. Kowalski, B.A. Orlowski, J. Ghijsen, You Li-Ming, R.L. Johnson, J. Electron Spectrosc. Relat. Phenom. 88-91, 321 (1998)
• 16. D.A. Shirley, Phys. Rev. B 12, 4709 (1972)
• 17. B.A. Orlowski, B.J. Kowalski, E. Guziewicz, K. Szamota-Sadowska, Acta Phys. Pol. B 30, 2097 (1999)
• 18. S. Senba, K. Fujimoto, H. Sato, Y. Fukuma, N. Nakatake, M. Arita, K. Tsuji, H. Asada, T. Kayanagi, H. Namatame, M. Taniguchi, J. Electron Spectrosc. Relat. Phenom. 114-147, 629 (2005)
• 19. M.A. Pietrzyk, B.J. Kowalski, B.A. Orlowski, W. Knoff, V. Osinniy, I.A. Kowalik, T. Story, R.L. Johnson, Acta Phys. Pol. A 112, 275 (2007)
• 20. B.J. Kowalski, M.A. Pietrzyk, B.A. Orlowski, P. Dziawa, V. Osinniy, J. Pelka, W. Dobrowolski, V.E. Slynko, E.I. Slynko, R.L. Johnson, J. Electron Spectrosc. Relat. Phenom. 156, 315 (2007)
• 21. B.A. Orlowski, B.J. Kowalski, M. Pietrzyk, S. Mickievicius, V. Osinniy, P. Dziawa, T. Story, W. Drube, R.L. Johnson, J. Electronom. Spectrosc. Relat. Phenom. 156, 315 (2007)
• 22. B.A. Orlowski, P. Dziawa, B. Kowalski, I. Kowalik, M. Pietrzyk, V. Osinniy, T. Story, S. Mickievicius, R. Johnson, Appl. Surf. Sci. 252, 5379 (2006)
• 23. V. Osinniy, B.A. Orlowski, P. Dziawa, B.J. Kowalski, M. Pietrzyk, B. Taliashvili, S. Mickievicius, T. Story, R.L. Johnson, Bull. Polish Synchr. Rad. Soc. 5, 213 (2006) (in Polish)
• 24. P. Dziawa, B.A. Orlowski, V. Osinniy, M. Pietrzyk, M. Taliashvili, T. Story, R.L. Story, Mater. Sci. 25, 377 (2007)
• 25. B.J. Kowalski, E. Guziewicz, B.A. Orlowski, J. Ghijsen, R.L. Johnson, in: Proc. Fifth National Symp. on Synchrotron Radiation Users, Eds. M. Lefeld-Sosnowska, J. Gronkowski, Uniwersytet Warszawski, Warszawa 1999, p. 89
• 26. B.J. Kowalski, Z. Golacki, E. Guziewicz, A. Kozanecki, B.A. Orlowski, J. Ghijsen, R.L. Johnson, J. Alloys Comp. 286, 121 (1999)
• 27. B.J. Kowalski, Z. Golacki, E. Guziewicz, B.A. Orlowski, J. Ghijsen, R.L. Johnson, in: Proc. 11th Int. Conf. on Ternary and Multinary Comp., Salford (UK), Conference Series 152G, 1997, Institute of Physics, Bristol 1998, p. 885
• 28. B.J. Kowalski, J. Ghijsen, Z. Golacki, E. Guziewicz, T. Story, M. Arciszewska, B.A. Orlowski, R.L. Johnson, J. Electron Spectrosc. Relat. Phenom. 88-90, 327 (1998)
• 29. W. Burian, J. Szade, T. O'Keevan, Z. Celiński, Phys. Status Solidi B 241, 15 (2004)
• 30. B.A. Orlowski, B.J. Kowalski, E. Guziewicz, K. Szamota-Sadowska, Acta Phys. Pol. B 30, 2097 (1999)
• 31. E. Guziewicz, B.A. Orlowski, B.J. Kowalski, I. Grzegory, S. Porowski, Appl. Surf. Sci. 190, 356 (2002)
• 32. E. Guziewicz, B.J. Kowalski, B.A. Orlowski, A. Szczepanska, Z. Golacki, I. Grzegory, S. Porowski, R.L. Johnson, I.A. Kowalik, Surf. Sci. 551, 132 (2004)

Identifiers

DOI

10.12693/APhysPolA.114.S-103