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2008 | 114 | 6A | A-121-A-126
Article title

The Influence of a Nanometric Layer with a High Refracting Index οn the Sensitivity οf the Difference Interferometer

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Content
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Languages of publication
EN
Abstracts
EN
Planar waveguides in which some range of the waveguide was modified by depositing on it a layer of some other dielectric, are called composite optical waveguides. Such a structure is based on a planar waveguide obtained by means of ion exchange K^+-Na^+ on glass, and covered by an adequately profiled dielectric layer. This kind of structure is of much interest due to considerable possibilities of taking measurements, which may contribute to a further development of the optoelectronic sensor. Especially required are sensor systems in chemistry, biochemistry, biotechnology, and others. Investigations on the properties of composite layers constitute a continuation of investigations concerning the construction of interferometers, which are very sensitive, cheap and easy to be produced.
Keywords
EN
Year
Volume
114
Issue
6A
Pages
A-121-A-126
Physical description
Dates
published
2008-12
References
  • 1. T. Pustelny, Physical and Technical Aspects of Optoelectronic Sensors, Publisher of Silesian University of Technology, Gliwice 2005
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  • 7. K. Gut, Mol. Quant. Acoust. 26, 91 (2005)
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  • 9. Z. Qi, A. Yimit, K. Itoh, M. Murabayashi, Opt. Lett. 25, 1427 (2000)
  • 10. B. Pustelny, T. Pustelny, Mol. Quant. Acoust. 28, 223 (2007)
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv114n6a20kz
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