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2008 | 114 | 5 | 1279-1283
Article title

Impedance Spectroscopy of Au-CdTe:Ga Schottky Contacts

Content
Title variants
Languages of publication
EN
Abstracts
EN
The dielectric response of Au-CdTe gallium doped Schottky contacts was investigated by impedance spectroscopy in the frequency range from 0.2 Hz to 3 MHz, at temperatures in the range from 77 K to 300 K. Combined modulus and impedance spectroscopic plots were analyzed to study the response of the structure. The data were fitted with the simple RC circuit composed of a depletion layer capacitance in parallel with resistance and a series resistance of the bulk CdTe:Ga. The activation energy of the bulk trap obtained from the Arrhenius plot of the resistance was found to be equal to 0.08 eV, close to the value 0.09 eV obtained from the impedance-modulus spectroscopy. The trap dominant in CdTe:Ga is possibly the DX center related, as it has been observed that this is the dominant trap in the material.
Keywords
EN
Year
Volume
114
Issue
5
Pages
1279-1283
Physical description
Dates
published
2008-11
received
2008-06-07
References
  • 1. A.K. Jonscher, Dielectric Relaxation in Solids, Chelsea Dielectric, London 1983
  • 2. J. Szatkowski, E. Płaczek-Popko, K. Sierański, B. Bieg, J. Cryst. Growth 197, 684 (1999)
  • 3. C.H. Park, D.J. Chadi, Phys. Rev. B 52, 11884 (1995)
  • 4. E. Płaczek-Popko, Z. Gumienny, J. Trzmiel, J. Szatkowski, Opt. Appl. 38, no. 3, in press
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv114n542kz
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