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2008 | 114 | 5 | 1193-1200
Article title

Determination of the Temperature Dependent Thermal Expansion Coefficients of Bulk AlN by HRXRD

Content
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Languages of publication
EN
Abstracts
EN
We measured the lattice constants of bulk aluminum nitride crystals at various temperatures by high resolution X-ray diffraction. By the use of a high temperature chamber and a X-ray cryostat a temperature regime from 20 to 1210 K was available. Furthermore, the measured data were fitted by Einstein- and Debye models which yield reliable parameters for the calculation of the thermal expansion coefficients of AlN.
Keywords
Publisher

Year
Volume
114
Issue
5
Pages
1193-1200
Physical description
Dates
published
2008-11
received
2008-06-07
Contributors
author
  • Institute of Solid State Physics, Section Semiconductor Epitaxy, University of Bremen, Otto-Hahn-Allee 1, D-28359 Bremen, Germany
author
  • Institute of Solid State Physics, Section Semiconductor Epitaxy, University of Bremen, Otto-Hahn-Allee 1, D-28359 Bremen, Germany
author
  • Institute of Solid State Physics, Section Semiconductor Epitaxy, University of Bremen, Otto-Hahn-Allee 1, D-28359 Bremen, Germany
author
  • Department of Materials Science 6, University of Erlangen-Nűrnberg, Martensstrasse 7, D-91058 Erlangen, Germany
References
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  • 9. S.N. Ivanov, P.A. Popov, B.I. Kornev, Phys. Solid State 39, 8183 (1997)
  • 10. C. Roder, S. Einfeld, S. Figge, D. Hommel, Phys. Rev. B 72, 085218 (2005)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv114n529kz
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