X-Ray High-Resolution Diffraction and Transmission Topography Study of InGaAs Grown by Liquid Encapsulated Czochralski Technique

• Authors: G. Kowalski , J. Gronkowski , J. Borowski , A. Hruban
• Languages of publication: EN

Abstracts

EN

New results on ternary InGaAs crystals grown using liquid encapsulated Czochralski technique with constant liquid composition are reported. X-ray high-resolution diffractometry (rocking curves and reciprocal space maps) as well as X-ray topography using the transmission Lang setup were used. Growth history of the bulk ingots was revealed.

Keywords

EN

61.72.Dd; 07.85.Jy; 81.10.Fq

Discipline

• 81.10.Fq: Growth from melts; zone melting and refining
• 07.85.Jy: Diffractometers
• 61.72.Dd: Experimental determination of defects by diffraction and scattering

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2008
• Volume: 114
• Issue: 2
• Pages: 391-398

Dates

published

2008-08

received

2007-09-24

Contributors

author

G. Kowalski

• Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland

author

J. Gronkowski

• Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland

author

J. Borowski

• Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland

author

A. Hruban

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

References

• 1. S. Ishida, T. Miaymoto, F. Koyama, Japan J. Appl. Phys. 45, L723 (2006)
• 2. L. Zhu, J. Li, D. Chen, F. Xiong, Chin. J. Semicond. 14, 208 (1993)
• 3. S. Wang, W. Wang, H. Zhu, L. Zhao, R. Zhang, F. Zhou, H. Shu, R. Wang, J. Cryst. Growth 260, 464 (2004)
• 4. D.N. Bose, P. Baneri, D. Pal, Proc. SPIE ISOE 3975, 142 (2000)
• 5. Q.K. Yang, J.X. Chen, A.Z. Li, J. Cryst. Growth 209, 8 (2000)
• 6. H.F. Liu, N. Xiang, H.L. Zhou, S.J. Chua, P. Yang, H.O. Moser, J. Cryst. Growth 301-302, 548 (2007)
• 7. H.J. Sell, J. Cryst. Growth 107, 396 (1991)
• 8. Y. Hayakawa, T. Ozawa, T. Araki, M. Komagawa, J. Cryst. Growth 275, e421 (2005)
• 9. H. Sheibani, S. Dost, S. Sakai, B. Lent, J. Cryst. Growth 258, 283 (2003)
• 10. Y. Nisjima, O. Akasaka, K. Nakajima, K. Otsubo, H. Ishikawa, in: Proc. Int. Conf. on Indium Phosphide and Related Materials, IEEE, Nara, Japan 2001, p. 125
• 11. K. Nakajima, T. Kusunoki, K. Kitahara, H. Ishikawa, in: Proc. 5th Int. Conf. on Indium Phosphide and Related Materials, IEEE, Paris, France, 1993, p. 305
• 12. K. Nakajima, T. Kusunoki, J. Cryst. Growth 169, 217 (1996)
• 13. U. Pietsch, V. Holý, T. Baumbach, High-Resolution X-Ray Scattering, Springer Verlag, Berlin 2004
• 14. A. Authier, Dynamical Theory of X-Ray Diffraction, Oxford University Press, Oxford 2001
• 15. P.F. Fewster, in: X-Ray and Neutron Dynamical Diffraction. Theory and Applications, Eds. A. Authier, S. Lagomarsino, B.K. Tanner, NATO ASI Series B, Physics, Vol. 357, Plenum Press, New York 1996
• 16. A.R. Lang, Acta Crystallogr. 12, 49 (1959)
• 17. D. Korytár, C. Ferrari, Acta Phys. Slov. 51, 9 (2001)
• 18. K. Nakajima, T. Kusunoki, C. Takenaka, J. Cryst. Growth 113, 485 (1991)

Identifiers

DOI

10.12693/APhysPolA.114.391