Journal
Article title
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Abstracts
Millimeter wave bridge technique for non-destructive material homogeneity characterization is described. The idea of this technique is the local excitation of the millimeter waves in the testing material and the measurement of the transmitted (reflected) wave amplitude and phase in different places of it, i.e. the material plate is scanned by the beam of the millimeter waves. The results of the homogeneity measurements for dielectric wafers according to dielectric constant anisotropy are presented. The measurement technique sensitivity is discussed.
Discipline
Journal
Year
Volume
Issue
Pages
1051-1054
Physical description
Dates
published
2008-03
received
2007-08-26
Contributors
author
- Semiconductor Physics Institute, A. Goštauto 11, 01108 Vilnius, Lithuania
author
- JSC "ELMIKA", Naugarduko 41, 03227 Vilnius, Lithuania
author
- JSC "ELMIKA", Naugarduko 41, 03227 Vilnius, Lithuania
author
- JSC "ELMIKA", Naugarduko 41, 03227 Vilnius, Lithuania
References
- 1. A. Laurinavičius, T. Anbinderis, O. Martjanova, J. Prišutov, A. Abrutis, A. Teišerskis, Int. J. Infrared Millim. Waves 22, 961 (2001)
- 2. A. Laurinavičius, T. Anbinderis, Yu. Prishutov, O. Martjanova, Electron. Lett. 39, 1315 (2003)
- 3.Ž. Kancleris, A. Laurinavičius, T. Anbinderis, Int. J. Infrared Millim. Waves 25, 1099 (2004)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv113n360kz