PL EN


Preferences help
enabled [disable] Abstract
Number of results
2008 | 113 | 3 | 1051-1054
Article title

Non-Destructive Material Homogeneity Evaluation Using Scanning Millimeter Wave Microscopy

Content
Title variants
Languages of publication
EN
Abstracts
EN
Millimeter wave bridge technique for non-destructive material homogeneity characterization is described. The idea of this technique is the local excitation of the millimeter waves in the testing material and the measurement of the transmitted (reflected) wave amplitude and phase in different places of it, i.e. the material plate is scanned by the beam of the millimeter waves. The results of the homogeneity measurements for dielectric wafers according to dielectric constant anisotropy are presented. The measurement technique sensitivity is discussed.
Keywords
EN
Year
Volume
113
Issue
3
Pages
1051-1054
Physical description
Dates
published
2008-03
received
2007-08-26
References
  • 1. A. Laurinavičius, T. Anbinderis, O. Martjanova, J. Prišutov, A. Abrutis, A. Teišerskis, Int. J. Infrared Millim. Waves 22, 961 (2001)
  • 2. A. Laurinavičius, T. Anbinderis, Yu. Prishutov, O. Martjanova, Electron. Lett. 39, 1315 (2003)
  • 3.Ž. Kancleris, A. Laurinavičius, T. Anbinderis, Int. J. Infrared Millim. Waves 25, 1099 (2004)
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv113n360kz
Identifiers
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.