Non-Destructive Material Homogeneity Evaluation Using Scanning Millimeter Wave Microscopy

• Authors: A. Laurinavičius , T. Anbinderis , J. Ikonikova , Yu. Prishutov
• Languages of publication: EN

Abstracts

EN

Millimeter wave bridge technique for non-destructive material homogeneity characterization is described. The idea of this technique is the local excitation of the millimeter waves in the testing material and the measurement of the transmitted (reflected) wave amplitude and phase in different places of it, i.e. the material plate is scanned by the beam of the millimeter waves. The results of the homogeneity measurements for dielectric wafers according to dielectric constant anisotropy are presented. The measurement technique sensitivity is discussed.

Keywords

EN

78.70.Gq   81.70.Ex  

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2008
• Volume: 113
• Issue: 3
• Pages: 1051-1054

Dates

published

2008-03

received

2007-08-26

References

• 1. A. Laurinavičius, T. Anbinderis, O. Martjanova, J. Prišutov, A. Abrutis, A. Teišerskis, Int. J. Infrared Millim. Waves 22, 961 (2001)
• 2. A. Laurinavičius, T. Anbinderis, Yu. Prishutov, O. Martjanova, Electron. Lett. 39, 1315 (2003)
• 3.Ž. Kancleris, A. Laurinavičius, T. Anbinderis, Int. J. Infrared Millim. Waves 25, 1099 (2004)

Identifiers

DOI

10.12693/APhysPolA.113.1051