Modeling of THz-Electro-Optical Sampling Measurements

• Authors: P. Shiktorov , E. Starikov , V. Gružinskis , L. Varani , L. Reggiani
• Languages of publication: EN

Abstracts

EN

We carry out a theoretical analysis of THz-electro-optical sampling experimental technique applied to semiconductor structures. The difficulties/impossibility of determining the small-signal conductivity spectrum in the framework of such a technique are analyzed and discussed.

Keywords

EN

72.20.Ht; 72.30.+q

Discipline

• 72.20.Ht: High-field and nonlinear effects
• 72.30.+q: High-frequency effects; plasma effects

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2008
• Volume: 113
• Issue: 3
• Pages: 913-916

Dates

published

2008-03

received

2007-08-26

Contributors

author

P. Shiktorov

• Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania

author

E. Starikov

• Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania

author

V. Gružinskis

• Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania

author

L. Varani

• Institut d"Electronique du Sud (CNRS UMR 5214), UniversitéMontpellier 2, Pl. Eugène Bataillon, 34095 Montpellier Cedex 5, France

author

L. Reggiani

• Dipartimento di Ingegneria dell'Innovazione, Universitàdel Salento and CNISM, Via Arnesano s/n, I-73100 Lecce, Italy

References

• 1. Y. Shimada, H. Hirakawa, M. Odnobliudov, A.A. Chao, Phys. Rev. Lett. 90, 046806 (2003)
• 2. N. Sekile, H. Hirokawa, Phys. Rev. Lett. 94, 057408 (2005)
• 3. A. Lisauskas, N.V. Demarina, E. Mohler, H.G. Roskos in: Proc. ICPS, 2006, arXiv:cond-mat/0605651
• 4. S.A. Ktitorov, G.S. Simin, V.Y. Sindalovskii, Sov. Phys. Solid State 13, 1872 (1972)
• 5. V. Gruzhinskis, E. Starikov, P. Shiktorov, L. Reggiani, M. Saraniti, L. Varani, Semicond. Sci. Technol. 8, 1283 (1993)

Identifiers

DOI

10.12693/APhysPolA.113.913