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Number of results
2008 | 113 | 3 | 913-916
Article title

Modeling of THz-Electro-Optical Sampling Measurements

Content
Title variants
Languages of publication
EN
Abstracts
EN
We carry out a theoretical analysis of THz-electro-optical sampling experimental technique applied to semiconductor structures. The difficulties/impossibility of determining the small-signal conductivity spectrum in the framework of such a technique are analyzed and discussed.
Keywords
EN
Publisher

Year
Volume
113
Issue
3
Pages
913-916
Physical description
Dates
published
2008-03
received
2007-08-26
Contributors
author
  • Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania
author
  • Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania
  • Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania
author
  • Institut d"Electronique du Sud (CNRS UMR 5214), UniversitéMontpellier 2, Pl. Eugène Bataillon, 34095 Montpellier Cedex 5, France
author
  • Dipartimento di Ingegneria dell'Innovazione, Universitàdel Salento and CNISM, Via Arnesano s/n, I-73100 Lecce, Italy
References
  • 1. Y. Shimada, H. Hirakawa, M. Odnobliudov, A.A. Chao, Phys. Rev. Lett. 90, 046806 (2003)
  • 2. N. Sekile, H. Hirokawa, Phys. Rev. Lett. 94, 057408 (2005)
  • 3. A. Lisauskas, N.V. Demarina, E. Mohler, H.G. Roskos in: Proc. ICPS, 2006, arXiv:cond-mat/0605651
  • 4. S.A. Ktitorov, G.S. Simin, V.Y. Sindalovskii, Sov. Phys. Solid State 13, 1872 (1972)
  • 5. V. Gruzhinskis, E. Starikov, P. Shiktorov, L. Reggiani, M. Saraniti, L. Varani, Semicond. Sci. Technol. 8, 1283 (1993)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv113n327kz
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