Layer and Interface Structure of CoFe/Ru Multilayers

• Authors: A. Pym , A. Lamperti , S. Cardoso , P. Freitas , B. Tanner
• Languages of publication: EN

Abstracts

EN

Grazing incidence X-ray scattering measurements have been performed to probe the structure of CoFe/Ru layers and their interfaces. It was found that the interface width increased approximately linearly with the layer number from the substrate in a multilayer and that a substantial asymmetry existed between the width of CoFe/Ru and Ru/CoFe interfaces. By co-minimizing both the specular and diffuse scatter with that simulated from a model structure, the topological roughness amplitude was determined to be comparable to the intermixing interface width.

Keywords

EN

61.10.Kw; 68.65.Ac; 68.35.Ct; 75.50.Kj; 85.75.Dd; 85.70.Ay

Discipline

• 68.35.Ct: Interface structure and roughness
• 85.70.Ay: Magnetic device characterization, design, and modeling
• 85.75.Dd: Magnetic memory using magnetic tunnel junctions
• 75.50.Kj: Amorphous and quasicrystalline magnetic materials
• 68.65.Ac: Multilayers

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2007
• Volume: 112
• Issue: 6
• Pages: 1243-1248

Dates

published

2007-12

received

2007-07-04

Contributors

author

A. Pym

• Department of Physics, Durham University, South Road, Durham DH1 3LE UK

author

A. Lamperti

• Department of Physics, Durham University, South Road, Durham DH1 3LE UK

author

S. Cardoso

• INESC-MN, Rua Alves Redol 9, 1000-029 Lisboa, Portugal

author

P. Freitas

• INESC-MN, Rua Alves Redol 9, 1000-029 Lisboa, Portugal

author

B. Tanner

• Department of Physics, Durham University, Soath Road, Durham DH1 3LE UK

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Identifiers

DOI

10.12693/APhysPolA.112.1243