Calculation of Optical Parameters of Liquid Crystals

• Authors: A. Kumar
• Languages of publication: EN

Abstracts

EN

Validation of a modified four-parameter model describing temperature effect on liquid crystal refractive indices is being reported in the present article. This model is based upon the Vuks equation. Experimental data of ordinary and extraordinary refractive indices for two liquid crystal samples MLC-9200-000 and MLC-6608 are used to validate the above-mentioned theoretical model. Using these experimental data, birefringence, order parameter, normalized polarizabilities, and the temperature gradient of refractive indices are determined. Two methods: directly using birefringence measurements and using Haller's extrapolation procedure are adopted for the determination of order parameter. Both approches of order parameter calculation are compared. The temperature dependences of all these parameters are discussed. A close agreement between theory and experiment is obtained.

Keywords

EN

78.20.-e; 78.20.Ci; 78.20.Fm; 77.84.Nh

Discipline

• 78.20.Fm: Birefringence
• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 77.84.Nh: Liquids, emulsions, and suspensions; liquid crystals(for structure of liquid crystals, see 61.30.-v)
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2007
• Volume: 112
• Issue: 6
• Pages: 1213-1221

Dates

published

2007-12

received

2007-07-16

(unknown)

2007-11-05

Contributors

author

A. Kumar

• Department of Physics, Vardhman College Bijnor, Bijnor-246701, UP, India

References

• 1. G.L. Ellis, B. Williamson, J. White, J. Emerg. Med., 7, 675 (1989)
• 2. S. Sato, Opt. Rev., 6, 471 (1999)
• 3. F. Li, N. Mukohzaka, N. Yoshida, Opt. Rev., 174, 98 (19
• 4. W. Haase, F. Podgornov, J. Opt. Tech.) 68, 677, 01 (20
• 5. A. Jakli, L.C. Chien, Liq. Cryst.) 29, 377, 02 (20
• 6. S.T. Wu, Phys. Rev. A, 33, 1270 (1986))
• 7. S.T. Wu, C.S. Wu, M. Warenghem, M. Ismaili, Opt. Eng., 33, 1775 (1993)
• 8. E.M. Averynov, J. Opt. Tech., 64, 471 (1997)
• 9. J. Li, S. Gauza, S.T. Wu, J. Appl. Phys., 96, 19 (2004)
• 10. T.N. Soorya, S. Gupta, A. Kumar, S. Jain, V.P. Arora, B. Bahadur, Ind. J. Pure Appl. Phys., 44, 524 (2006)
• 11. J. Li, C.H. Wen, S. Gauza, R. Lu, S.T. Wu, IEEE/OSA J. Disp. Tech., 51, (2005)
• 12. B.J. Zywucki, W. Kuczynski, IEEE J. Trans. Dielec. Elec. Insl., 512, (2001)
• 13. I. Haller, Prog. Solid State Chem., 10, 103 (1975)
• 14. M.F. Vuks, Opt. Spektrosk., 20, 644 (1966)
• 15. A.K. Garg, V.K. Agarwal, B. Bahadur, Mol. Cryst. Liq. Cryst., 130, 11 (1985)
• 16. R.K. Sarna, B. Bahadur, V.G. Bhide, Mol. Cryst. Liq. Cryst., 51, 117 (1979)

Identifiers

DOI

10.12693/APhysPolA.112.1213