Surface Plasmon-Polariton Assisted Metal-Dielectric Multilayers as Passband Filters for Ultraviolet Range

• Authors: Z. Jakšić , M. Maksimović , M. Sarajlić , D. Tanasković
• Languages of publication: EN

Abstracts

EN

We designed and fabricated metal-dielectric multilayers intended for passband filters in the ultraviolet range. We determined the dispersion characteristics by the Bloch approach to evanescent wave resonant coupling and calculated the spectral characteristics using the transfer matrix method while taking into account real dispersion and absorptive losses. We considered the influence of nanoscale interface roughness as a means to couple evanescent electromagnetic field to the propagating far field modes. In our structures both propagating and evanescent modes contribute to the overall performance, resulting in an enhanced transmission in the desired range, while retaining a strong suppression of undesired frequencies of more than four orders of magnitude. In our experiments we used radiofrequent sputtering of silver and silica and characterized our multilayers by UV-vis spectroscopy.

Keywords

EN

42.79.Wc; 42.79.Ci; 42.25.Bs; 42.25.Hz; 42.70.Qs

Discipline

• 42.70.Qs: Photonic bandgap materials(for photonic crystal lasers, see 42.55.Tv)
• 42.25.Bs: Wave propagation, transmission and absorption[see also 41.20.Jb—in electromagnetism; for propagation in atmosphere, see 42.68.Ay; see also 52.40.Db Electromagnetic (nonlaser) radiation interactions with plasma and 52.38-r Laser-plasma interactions—in plasma physics]
• 42.79.Ci: Filters, zone plates, and polarizers
• 42.79.Wc: Optical coatings
• 42.25.Hz: Interference

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2007
• Volume: 112
• Issue: 5
• Pages: 953-958

Dates

published

2007-11

received

2007-09-03

Contributors

author

Z. Jakšić

• Institute of Microelectronic Technologies and Single Crystals, Institute of Chemistry, Technology and Metallurgy, University of Belgrade, Belgrade, Serbia

author

M. Maksimović

• Dept. of Applied Mathematics, University of Twente, The Netherlands, Twente, The Netherlands

author

M. Sarajlić

• Institute of Microelectronic Technologies and Single Crystals, Institute of Chemistry, Technology and Metallurgy, University of Belgrade, Belgrade, Serbia

author

D. Tanasković

• Institute of Microelectronic Technologies and Single Crystals, Institute of Chemistry, Technology and Metallurgy, University of Belgrade, Belgrade, Serbia

References

• 1. H.A. Macleod, Thin-Film Optical Filters, Institute of Physics Publishing, Bristol 2001
• 2. J.B. Pendry, Phys. Rev. Lett., 85, 3966, 2000
• 3. S.A. Ramakrishna, Rep. Prog. Phys., 68, 449, 2005
• 4. M. Scalora, M.J. Bloemer, A.S. Pethel, J.P. Dowling, C.M. Bowden, A.S. Manka, J. Appl. Phys., 83, 2377, 1998
• 5. Z. Jaksić, M. Maksimović, M. Sarajlić, J. Opt. A, Pure Appl. Opt., 7, 51, 2005
• 6. N. Fang, H. Lee, C. Sun, X. Zhang, Science, 308, 534, 2005
• 7. S. Feng, J.M. Elson, P.L. Overfelt, Phys. Rev. B, 72, 085117, 2005
• 8. A. Yariv, Y. Xu, R.K. Lee, A. Scherer, Opt. Lett., 24, 711, 1999
• 9. H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer-Verlag, Berlin 1986
• 10. S. Feng, J.M. Elson, P.L. Overfelt, Opt. Express, 13, 4113, 2005
• 11. M. Maksimović, Z. Jaksić, Phys. Lett. A, 342, 497, 2005

Identifiers

DOI

10.12693/APhysPolA.112.953