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2007 | 111 | 1 | 185-188
Article title

Strain Relaxation in Thin Films of La_{1.85}Sr_{0.15}CuO_4 Grown by Pulsed Laser Deposition

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Abstracts
EN
X-ray diffraction, resistivity, and susceptibility measurements are used to examine the effects of film thickness d (from 17 to 250 nm) on the structural and superconducting properties of La_{1.85}Sr_{0.15}CuO_4 films grown by pulsed laser deposition on SrLaAlO_4 substrates. For each d the film sgrow with a variable strain, ranging from a large compressive strain in the thinnest films to a negligible or tensile strain in thick films. Our results indicate that the tensile strain is not caused by the off-stoichiometric layer at the substrate-film interface. Instead, it may be caused by the extreme oxygen deficiency in some of the films.
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Contributors
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
References
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  • 6. M.Z. Cieplak, A. Malinowski, K. Karpińska, S. Guha, A. Krickser, B. Kim, Q. Wu, C.H. Shang, M. Berkowski, P. Lindenfeld, Phys. Rev. B, 65, 100504R, 2002
  • 7. A. Malinowski, M.Z. Cieplak, S. Guha, Q. Wu, B. Kim, A. Krickser, A. Perali, K. Karpińska, M. Berkowski, C.H. Shang, P. Lindenfeld, Phys. Rev. B, 66, 104512, 2002
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv111n125kz
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