Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

• Authors: B Lesiak , A Kosiński , A Jablonski , A Sulyok , G Gergely , J Tóth , D Varga
• Languages of publication: EN

Abstracts

EN

In this work, the influence of recoil effect and surface excitations on the inelastic mean free paths for polythiophenes is investigated. The inelastic mean free paths of electrons in polythiophenes are measured with the elastic peak electron spectroscopy method using the Ag standard and the electron elastic scattering cross-sections from the database NIST 3.1 in the electron kinetic energy range 200-5000 eV. The Monte Carlo model is applied for evaluating the electron backscattering intensities from the polymers and the Ag standard, as well as for evaluating electrons quasi-elastically backscattered from atoms of different atomic numbers (the recoil effect). The surface excitation corrections are accounted for using the formalism of Chen, with the material parameters for polythiophenes evaluated from the elastic peak electron spectroscopy method. Deviations due to recoil effect and surface excitations to the inelastic mean free paths are compared and discussed. Correction to the inelastic mean free paths due to recoil effect is considerable but is smaller, however, than the correction due to surface excitations. Accounting for recoil effect and surface excitations leads to improvement of the inelastic mean free paths, as compared to the inelastic mean free paths resulting from the predictive formulae of Gries.

Keywords

EN

82.35.Cd; 82.80.Pv; 87.16.Ac

Discipline

• 82.80.Pv: Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
• 82.35.Cd: Conducting polymers

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2006
• Volume: 109
• Issue: 6
• Pages: 789-800

Dates

published

2006-06

received

2005-07-11

(unknown)

2006-01-20

(unknown)

2006-03-14

Contributors

author

B Lesiak

• Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland

author

A Kosiński

• Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland

author

A Jablonski

• Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland

author

A Sulyok

• Institute for Technical Physics and Materials Science, Hungarian Academy of Sciences, P.O. Box 49, 1545 Budapest, Hungary

author

G Gergely

• Institute for Technical Physics and Materials Science, Hungarian Academy of Sciences, P.O. Box 49, 1545 Budapest, Hungary

author

J Tóth

• Research Institute for Nuclear Physics ATOMKI, Hungarian Academy of Sciences, P.O. Box 51, 4001, Debrecen, Hungary

author

D Varga

• Research Institute for Nuclear Physics ATOMKI, Hungarian Academy of Sciences, P.O. Box 51, 4001, Debrecen, Hungary

References

• 1. ASTM Standard E673-95c, Annual Book of ASTM Standards, Vol. 3.06, American Society for Testing and Materials, West Conshohocken, PA 1997, p. 907
• 2. C.J. Powell, A. Jablonski, J. Phys. Chem. Ref. Data, 28, 19, 1999
• 3. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal., 21, 165, 1994
• 4. W.H. Gries, Surf. Interface Anal., 24, 38, 1996
• 5. P.J. Cumpson, Surf. Interface Anal., 31, 23, 2001
• 6. B. Lesiak, A. Kosinski, M. Krawczyk, L. Zommer, A. Jablonski, J. Zemek, P. Jiricek, L. Kövér, J. Tóth, D. Varga, I. Cserny, Appl. Surf. Sci., 144, 168, 1999
• 7. B. Lesiak, A. Kosiński, M. Krawczyk, L. Zommer, A. Jablonski, L. Kövér, J. Tóth, D. Varga, I. Cserny, J. Zemek, P. Jiricek, Polish J. Chem., 74, 847, 2000
• 8. B. Lesiak, A. Jablonski, J. Zemek, M. Trchova, J. Stejskal, Langmuir, 16, 1415, 2000
• 9. B. Lesiak, A. Kosinski, A. Jablonski, L. Kövér, J. Tóth, D. Varga, I. Cserny, Surf. Interface Anal., 29, 614, 2000
• 10. B. Lesiak, A. Kosinski, A. Jablonski, L. Kövér, J. Tóth, D. Varga, I. Cserny, M. Zagorska, I. Kulszewicz-Bajer, G. Gergely, Appl. Surf. Sci., 174, 70, 2001
• 11. H. Börsch, P. Wolter, H. Schönebeck, Z. Phys., 199, 124, 1967
• 12. D. Laser, M.P. Seah, Phys. Rev. B, 47, 9836, 1993
• 13. A. Sulyok, G. Gergely, M. Menyhard, J. Tóth, D. Varga, L. Kövér, Z. Berenyi, B. Lesiak, A. Kosinski, Vacuum, 63, 371, 2001
• 14. D. Varga, K. Tökési, Z. Berényi, J. Tóth, L. Kövér, G. Gergely, A. Sulyok, Surf. Interface Anal., 31, 1019, 2001
• 15. S. Tanuma, S. Ichimura, K. Goto, J. Surf. Anal., 5, 48, 1999
• 16. S. Gurban, G. Gergely, M. Menyhard, J. Adam, M. Adamik, Cs. Daroczi, J. Tóth, D. Varga, A. Csik, B. Gruzza, Surf. Interface Anal., 34, 206, 2002
• 17. J. Zemek, P. Jiricek, B. Lesiak, A. Jablonski, Surf. Sci., 531, L335, 2003
• 18. G. Gergely, M. Menyhard, B. Lesiak, A. Kosiński, R. Nowakowski, A. Jablonski, J. Tóth, D. Varga, Appl. Surf. Sci., in press
• 19. G. Gergely, Prog. Surf. Sci., 71, 31, 2002
• 20. R. Oswald, Ph.D. thesis, University of Tübingen, 1992
• 21. W.S.M. Werner, Surf. Interface Anal., 31, 141, 2001
• 22. W.S.M. Werner, W. Smekal, Ch. Tomastik, H. Störi, Surf. Sci. Lett., 461, 486, 2001
• 23. Y.F. Chen, Surf. Sci., 519, 115, 2002
• 24. A. Jablonski, P. Jiricek, Surf. Sci., 412/413, 42, 1998
• 25. A. Jablonski, Surf. Interface Anal., 37, 1035, 2005
• 26. A. Jablonski, F. Salvat, C.J. Powell, NIST Electron Elastic-Scattering Cross-Section Database, Version 3.1, Standard Reference Data Program, Database 64, National Institute of Standard and Technology, Gaithersburg, MD 2003; http://www.nist.gov/srd/nist64.html
• 27. G.T. Orosz, A. Sulyok, G. Gergely, S. Gurban, M. Menyhard, Microsc. Microanal., 9, 343, 2003
• 28. G. Gergely, J. Tóth, M. Menyhard, D. Varga, S. Gurban, A. Sulyok, A. Kosinski, B. Lesiak, A. Jablonski, R. Nowakowski, J. Electron Spectrosc. Relat. Phenom., submitted for publication
• 29. J. Roncali, Chem. Rev., 92, 711, 1992
• 30. R. Sugimoto, S. Takeda, M.V. Gu, K. Yoshino, Chem. Express, 1, 635, 1986
• 31. M. Zagórska, M. Krische, Polymer, 31, 1379, 1990
• 32. M. Zagórska, I. Kulszewicz-Bajer, A. Pron, P. Barta, F. Cacialli, R.H. Friend, Synth. Met., 101, 142, 1999
• 33. A. Presz, M. Skibska, M. Pilecki, Powder Handling and Processing, 7, 321, 1995
• 34. L. Kövér, D. Varga, I. Cserny, J. Tóth, K. Tökési, Surf. Interface Anal., 19, 199, 1992
• 35. J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Perkin Elmer Co., Eden Prairie, Minnesota 1992
• 36. P. Jiricek, J. Zemek, P. Lejćek, B. Lesiak, A. Jablonski, M. Ċerñanský, J. Vac. Sci. Technol. A, 20, 447, 2002
• 37. B. Lesiak, A. Jablonski, J. Zemek, P. Jiricek, J. Pavluch, Surf. Interface Anal., 33, 381, 2002
• 38. J. Zemek, P. Jiricek, A. Jablonski, B. Lesiak, Surf. Interface Anal., 34, 215, 2002
• 39. W.S.M. Werner, L. Kövér, S. Egri, J. Tóth, D. Varga, Surf. Sci., 585, 85, 2005
• 40. A. Jablonski, C.J. Powell, Surf. Sci. Rep., 47, 33, 1992
• 41. C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal, Appl. Surf. Sci., 239, 470, 2005

Identifiers

DOI

10.12693/APhysPolA.109.789