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Abstracts
The X-ray diffraction and atomic force microscopy are used to examine the microstructure of La_{1.85}Sr_{0.15}CuO_4 films grown by pulsed laser deposition on LaSrAlO_4 substrates. The films grow with different degrees of built-in strain, ranging from a large compressive to a large tensile in-plain strain. The tensile strain cannot be attributed to a substrate-related strain. The possible origins of the tensile strain are discussed.
Discipline
Journal
Year
Volume
Issue
Pages
573-576
Physical description
Dates
published
2006-04
received
2005-09-25
Contributors
author
- Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland
author
- Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland
author
- Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland
author
- Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland
author
- Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08851, USA
author
- Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08851, USA
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv109n420kz