Effect of the In-Plane Epitaxial Mismatch between the Substrate and the Film on the Properties of YBa_2Cu_3O_{7-δ} Films

• Authors: I Abal'osheva , M Cieplak , Z Adamus , M Berkowski , V Domukhovski , M Aleszkiewicz
• Languages of publication: EN

Abstracts

EN

We study the effect of the in-plane epitaxial mismatch between the substrate and the film on the crystallographic structure and the transport properties of YBa_2Cu_3O_{7-δ} superconducting films of thicknesses ranging between 600 and 3000Å. The films are grown by pulsed laser deposition on the new type of single-crystalline substrates prepared by Czochralski method, with the chemical formula (SrAl_{0.5}Ta_{0.5}O_3)_{0.7}(CaAl_{0.5}Ta_{0.5}O_3)_{0 .1}(LaAlO_3)_{0.2}. We find that superconducting properties of the samples are excellent, and generally they improve with increasing of the film thickness as a result of improved structural ordering. We also investigate the influence of the film thickness on the behavior of the critical current densities.

Keywords

EN

68.55.Jk; 74.25.Sv; 81.15.Aa

Discipline

• 81.15.Aa: Theory and models of film growth
• 74.25.Sv: Critical currents

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2006
• Volume: 109
• Issue: 4-5
• Pages: 549-554

Dates

published

2006-04

received

2005-09-25

Contributors

author

I Abal'osheva

• Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland

author

M Cieplak

• Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland

author

Z Adamus

• Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland

author

M Berkowski

• Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland

author

V Domukhovski

• Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland

author

M Aleszkiewicz

• Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland

References

• 1. J.M. Philips, J. Appl. Phys., 79, 1829, 1996
• 2. E.A. Fitzgerald, Mater. Sci. Rep., 7, 87, 1991
• 3. T.J. Gosling, R. Bullough, S.C. Jain, J.R. Willis, J. Appl. Phys., 73, 8267, 1993
• 4. S.C. Jain, A.H. Harker, R.A. Cowley, Philos. Mag. A, 75, 1461, 1997
• 5. C.B. Eom, A.F. Marshall, Y. Suzuki, T.H. Geballe, B. Boyer, R.F.W. Pease, R.B. van Dover, J.M. Phillips, Phys. Rev B., 48, 18, 1992
• 6. P. Zhang, T. Haage, A. Kazimirov, H.-U. Habermeier, T. Ruf, M. Cardona, J. Alloys Comp., 251, 70, 1997
• 7. R.L.S. Emergo, J.Z. Wu, T. Aytug, D.K. Christen, Appl. Phys. Lett., 85, 618, 2002
• 8. B.W. Kang, A. Goyal, D.R. Lee, J.E. Mathis, E.D. Specht, P.M. Martin, D.M. Kroeger, M. Paranthaman, S. Sathyamurthy, J. Mater. Res., 17, 1750, 2002
• 9. M.S. Colclough, C.E. Keene, M. Gough, C.M. Muirhead, N. Thomas, J.S. Abell, S. Sutton, K.Y. Chen, B. Zhou, Nature, 328, 47, 1987
• 10. Y. Tanaka, S. Kashiwaya, Phys. Rev. B, 56, 892, 1997
• 11. M.B. Walker, J. Lüttmer-Strathmann, Phys. Rev. B, 54, 588, 1996

Identifiers

DOI

10.12693/APhysPolA.109.549