Elemental Mapping of Prostate Tissue by Micro-SRIXE

• Authors: A Banaś , K Banaś , G Falkenberg , G Dyduch , W Kwiatek
• Languages of publication: EN

Abstracts

EN

Synchrotron radiation-induced X-ray emission is now a proven analytical method for the determination of trace elements. Better insight of the role of trace elements in tissue samples can be gained by acquiring complete distribution maps of these elements. Our approach is based on the acquisition of digital maps. In this contribution we present two different methods for obtaining normalization matrix: first - based on argon intensity in the single spectrum and second - based on changes of beam current intensity. The region for the scan was carefully chosen according to the histological view of the sample. A total area was scanned with a step size of 15 μm in each direction and measuring time of 30 s per pixel. The thickness of the samples was 15 μm. A polycapillary was used for beam focusing. At the energy of 18 keV the beam size on the sample was approximately 15 μm which is of the order of a cell diameter.

Keywords

EN

87.64.-t

Discipline

• 87.64.-t: Spectroscopic and microscopic techniques in biophysics and medical physics

• Journal: Acta Physica Polonica A
• Year: 2006
• Volume: 109
• Issue: 3
• Pages: 323-328

Dates

published

2006-03

received

2005-05-20

Contributors

author

A Banaś

• The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Krakó Poland

author

K Banaś

• The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Krakó Poland

author

G Falkenberg

• HASYLAB, DESY, Notkestr. 85, 22603 Hamburg, Germany

author

G Dyduch

• Dept. of Pathomorphology, Collegium Medicum, Jagiellonian University, Kopernika 7, 31-034 Kraków, Poland

author

W Kwiatek

• The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Krakó Poland

References

• 1. W.M. Kwiatek, A. Banas, K. Banas, M. Gajda, M. Galka, G. Falkenberg, T. Cichocki, J. Alloys Comp., in press
• 2. K.W. Jones, W.J. Berry, D.J. Borsay, H.T. Cline, W.C. Conner Jr, C.S. Fullmer, X-Ray Spectrom., 26, 350, 1999
• 3. P. Van Espen, K. Janssens, I. Swensters, AXIL X-Ray Analysis Software --- Users Manual, Canberra-Packard, Benelux 1989, p. 48
• 4. J. Chwiej, M. Szczerbowska-Boruchowska, M. Lankosz, D. Adamek, J. Alloys Comp., in press

Identifiers

DOI

10.12693/APhysPolA.109.323