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2006 | 109 | 3 | 323-328
Article title

Elemental Mapping of Prostate Tissue by Micro-SRIXE

Content
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Languages of publication
EN
Abstracts
EN
Synchrotron radiation-induced X-ray emission is now a proven analytical method for the determination of trace elements. Better insight of the role of trace elements in tissue samples can be gained by acquiring complete distribution maps of these elements. Our approach is based on the acquisition of digital maps. In this contribution we present two different methods for obtaining normalization matrix: first - based on argon intensity in the single spectrum and second - based on changes of beam current intensity. The region for the scan was carefully chosen according to the histological view of the sample. A total area was scanned with a step size of 15 μm in each direction and measuring time of 30 s per pixel. The thickness of the samples was 15 μm. A polycapillary was used for beam focusing. At the energy of 18 keV the beam size on the sample was approximately 15 μm which is of the order of a cell diameter.
Keywords
EN
Publisher

Year
Volume
109
Issue
3
Pages
323-328
Physical description
Dates
published
2006-03
received
2005-05-20
Contributors
author
  • The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Krakó Poland
author
  • The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Krakó Poland
author
  • HASYLAB, DESY, Notkestr. 85, 22603 Hamburg, Germany
author
  • Dept. of Pathomorphology, Collegium Medicum, Jagiellonian University, Kopernika 7, 31-034 Kraków, Poland
author
  • The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Krakó Poland
References
  • 1. W.M. Kwiatek, A. Banas, K. Banas, M. Gajda, M. Galka, G. Falkenberg, T. Cichocki, J. Alloys Comp., in press
  • 2. K.W. Jones, W.J. Berry, D.J. Borsay, H.T. Cline, W.C. Conner Jr, C.S. Fullmer, X-Ray Spectrom., 26, 350, 1999
  • 3. P. Van Espen, K. Janssens, I. Swensters, AXIL X-Ray Analysis Software --- Users Manual, Canberra-Packard, Benelux 1989, p. 48
  • 4. J. Chwiej, M. Szczerbowska-Boruchowska, M. Lankosz, D. Adamek, J. Alloys Comp., in press
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv109n310kz
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