Investigation of Compound Relaxation Processes in Crystal Lattice Dynamics of Si Irradiated by Soft X-rays

A Janavičius; R Purlys; Ž Norgėla

doi:10.12693/APhysPolA.109.159

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Acta Physica Polonica A

2006 | 109 | 2 | 159-170

Article title

Investigation of Compound Relaxation Processes in Crystal Lattice Dynamics of Si Irradiated by Soft X-rays

Authors

A Janavičius , R Purlys , Ž Norgėla

Content

http://przyrbwn.icm.edu.pl/APP/PDF/109/a109z203.pdf [remote]

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Abstracts

We applied soft X-rays for investigation of dynamics of Frenkel point defects in a Si crystal during its saturation with metastable vacancies with neighboring Si atoms in excited states or vacancies with neighboring Si atoms in interstitial states produced in the lattice after ejection of Auger electrons. The irradiated irregularities and defects of the lattice cause a change of Bragg reflection maxima. Several resonance phenomena related to the metastable states introduced into Si crystal by soft X-rays irradiation have been detected.

Keywords

61.72.-y 61.72.Dd 05.50.+q

Publisher

Institute of Physics, Polish Academy of Sciences

Journal

Acta Physica Polonica A

Year

2006

Volume

109

Issue

Pages

159-170

Physical description

Dates

published

2006-02

received

2005-04-13

(unknown)

2005-09-20

References

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Document Type

Publication order reference

YADDA identifier

bwmeta1.element.bwnjournal-article-appv109n203kz

Identifiers

DOI

10.12693/APhysPolA.109.159