As of 1 April 2026, the PSJD database will become an archive and will no longer accept new data. Current publications from Polish scientific journals are available through the Library of Science: https://bibliotekanauki.pl
An approach to structural characterization of chalcogenide glasses based on the study of void distribution is discussed. The results of positron annihilation lifetime spectra measurements for glassy-like g-As_2Se_3 are compared with nano-void distribution data obtained from Monte Carlo simulation. In this consideration perspectives to involve the parameters of nano-voids calculated from the first sharp diffraction peak in the framework of known Elliott's model are analyzed.
6. A. Feltz, Amorphe und Glasartige Anorganische Festkorper, Akademie-Verlag, Berlin 1983
7. J. Kansy, Nucl. Instrum. Methods Phys. Res. A, 374, 235, 1996
8. R. Krause-Rehberg, H.S. Leipner, Positron Annihilation in Semiconductors. Defect Studies, Springer-Verlag, New York 1999
9. O. Shpotyuk, J. Filipecki, Free Volume in Vitreous Chalcogenide Semiconductors: Possibilities of Positron Annihilation Lifetime Study, WSP, Czestochowa 2003, p. 114
10. M.A. Popescu, J. Non-Cryst. Solids, 35-36, 549, 1980