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2004 | 106 | 2 | 265-272
Article title

Misfit Dislocations Study in MOVPE Grown Lattice-Mismatched InGaAs/GaAs Heterostructures by Means of DLTS Technique

Content
Title variants
Languages of publication
EN
Abstracts
EN
Two deep traps associated with lattice-mismatch induced defects in n-type In_{0.042}Ga_{0.958}As/GaAs heterostructures and three deep point traps were observed by means of DLTS method. In order to determine the overlapping DLTS-line peaks parameters precisely, high resolution Laplace DLTS studies werw performed. A simple procedure of distinguishing between point and extended defects in DLTS measurements was used.
Keywords
EN
Year
Volume
106
Issue
2
Pages
265-272
Physical description
Dates
published
2004-08
received
2004-05-28
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv106n206kz
Identifiers
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