EN
The correlation between magnetostatic or Néel's coupling and roughness of interfaces in sputtered Cu/Py/V/Py/MnIr/Cu multilayers was investigated with the help of atomic force microscopy and magnetometry. It is shown that the coupling strongly depends on the roughness of seed Cu layer which in turn depends on sputtering power. Roughness levels off after deposition of consecutive layers to about 0.2 nm rms.