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Abstracts
The correlation between magnetostatic or Néel's coupling and roughness of interfaces in sputtered Cu/Py/V/Py/MnIr/Cu multilayers was investigated with the help of atomic force microscopy and magnetometry. It is shown that the coupling strongly depends on the roughness of seed Cu layer which in turn depends on sputtering power. Roughness levels off after deposition of consecutive layers to about 0.2 nm rms.
Discipline
Journal
Year
Volume
Issue
Pages
307-313
Physical description
Dates
published
2004-03
received
2003-11-29
Contributors
author
- Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
- University of Bielefeld, Department of Physics, P.O. Box 100131, 33501 Bielefeld, Germany
author
- Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
- Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
- University of Bielefeld, Department of Physics, P.O. Box 100131, 33501 Bielefeld, Germany
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv105n308kz