Fabrication and Characterization of Semiconductor CuCl Nanocrystals

• Authors: S. Mahtout , M. Belkhir , M. Samah
• Languages of publication: EN

Abstracts

EN

CuCl nanocrystals were elaborated in a NaCl ionic matrix by doping the latter with copper powder during growth. Optical absorption measurements revealed nanocrystals with a mean size of order 32 Å. This is consolidated by the Raman scattering measurements which showed nanodomains of similar size. X-ray diffraction measurements indicate a good crystallinity of the matrix and confirm the presence of CuCl nanocrystals within our samples. The annealing effect at 300˚C showed an increase in CuCl nanocrystal size with annealing time and demonstrated clearly the existence of a compound containing copper within our samples.

Keywords

EN

78.67.-n; 78.40.Fy; 78.40.-q

Discipline

• 78.40.-q: Absorption and reflection spectra: visible and ultraviolet(for infrared spectra, see 78.30.-j; for optical spectra of superconductors, see 74.25.nd; for time resolved reflection spectroscopy, see 78.47.jg; for multiphoton absorption, see 79.20.Ws in impact phenomena)
• 78.67.-n: Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures(for magnetic properties of nanostructures, see 75.75.-c; for electronic transport in nanoscale structures, see 73.63.-b; for mechanical properties of nanoscale systems, see 62.25.-g)
• 78.40.Fy: Semiconductors

• Journal: Acta Physica Polonica A
• Year: 2004
• Volume: 105
• Issue: 3
• Pages: 279-286

Dates

published

2004-03

received

2003-08-07

Contributors

author

S. Mahtout

• Solid physics group, University of Bejaia, 06000 Bejaia, Algeria

author

M. Belkhir

• Solid physics group, University of Bejaia, 06000 Bejaia, Algeria

author

M. Samah

• Solid physics group, University of Bejaia, 06000 Bejaia, Algeria

References

• 1. R.W. Siegel, E.Hu, D.M. Kox, H. Goronkin, L. Jelinski, C.C. Koch, J. Mendel, R.C. Roco, D.T. Chaw, WTEC US Pannel Rapport International Technology Research Institut, 1999
• 2. P. Alivisatos, V. Colvin, U.S. Patent 5 018, 751, 1989
• 3. M. Bawendi, K. Jensen, B. Daboussi, J. Rodrigguez-Viego, F.V. Mikulec, U.S. Patent 6, 207 (2001)
• 4. M.A. Chamarro, V. Voliotis, R. Grousson, P. Lavallard, T. Gacoin, G. Counio, J.P. Boilot, R. Cases, J. Cryst. Growth 159, 853 (1996)
• 5. O. Lublinskaya, S. Gurevich, A. Ekimov, I. Kudryavtsev, A. Osinskii, M. Gandais, Y. Wang, J. Cryst. Growth 158, 203 (1995)
• 6. H. Kishishita, Phys. Status Solidi B 55, 399 (1973)
• 7. S. Nagasaka, M. Ikezawa, M. Veta, J. Phys. Soc. Japan 20, 1450 (1995)
• 8. T. Itoh, Phys. Status Solidi B 145, 567 (1988)
• 9. A. Van Dijken, E.A. Meulenkamp, D. Vanmaekelbergh, A. Meijerink, J. Lumin. 90, 123 (2000)
• 10. M. Cardona, Phys. Rev. 129, 69 (1963)
• 11. A. Goldmann, J. Tejeda, N.J. Shevchik, M. Cardona, Solid State Commun. 15, 1093 (1974)
• 12. S. Park, I. Kim, K. Jang, S. Kim, C.D. Kim, Y. Yee, G. Jeen, J. Phys. Soc. Jpn. 70, 3723 (2001)
• 13. A.I. Ekimov, Al.L. Efros, A.A. Onushchenko, Solid State Commun. 56, 921 (1985)
• 14. A.I. Ekimov, A.A. Onushchenko, A.G. Plyukhin, Al.L. Efros, Sov. Phys.-JETP 61, 891 (1985)
• 15. P. Gilliot, Ph.D. thesis, Université de Strasbourg, France, 1990
• 16. E. Duval, A. Boukenter, B. Champagnon, Phys. Rev. Lett. 56, 2052 (1986)
• 17. M. Philippe, Phys. Rev. Lett. B 77, 557 (1997)
• 18. C. Kittel, Solid State Physics, 5th ed., Dunod, Paris 1983 (in French)

Identifiers

DOI

10.12693/APhysPolA.105.279