PL EN


Preferences help
enabled [disable] Abstract
Number of results
2003 | 104 | 3-4 | 351-356
Article title

Scanning Tunnelling Spectroscopy of Periodic Nickel Nanoparticles

Content
Title variants
Languages of publication
EN
Abstracts
EN
Scanning tunneling microscopy/spectroscopy as well as atomic force microscopy were applied to study the non-structural and nanoelectronic properties of periodic nickel nanoparticles deposited on n-silicon substrates. Periodic nickel (Ni) nanoparticles were prepared by using nanosphere lithography and analyzed by scanning tunneling microscopy/spectroscopy and atomic force microscopy. By the evaporation of Ni perfectly ordered nanoparticles were produced and very good correlation between latex mask was observed. Finally, tunneling spectroscopy performed with non-magnetic tip yield information about local electronic properties of nanoscale structures at surface.
Keywords
EN
Publisher

Year
Volume
104
Issue
3-4
Pages
351-356
Physical description
Dates
published
2003-09/10
received
2003-07-16
Contributors
author
  • Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland
author
  • Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland
author
  • Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland
  • "CAESAR" Dept. Nanoparticle Technology, Ludwig-Erhard-Allee 2, 53175 Bonn, Germany
author
  • Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland
References
  • 1. R.S. Becker, J.A. Golovchenko, D.R. Hamann, B.S. Schwartzentruber, Phys. Rev. Lett., 55, 2032, 1985
  • 2. J.A. Stroscio, R.M. Feenstra, A.P. Fein, Phys. Rev. Lett., 57, 2579, 1986
  • 3. R.M. Feenstra, J.A. Stroscio, J. Tersoff, A.P. Fein, Phys. Rev. Lett., 58, 1992, 1987
  • 4. J. Rybczyński, U. Ebels, M. Giersig, Colloids and Surfaces A, Physicochem. Eng. Aspects, 219, 1-6, 2003
  • 5. R.M. Feenstra, J.A. Stroscio, A.P. Fein, Surf. Sci., 295, 181, 1987
  • 6. R.J. Hamers, STM on Semiconductors, in series Scanning Tunnelling Microscopy I, Eds. H.-J. Guntherodt, R. Wiesendanger, Springer Ser. Surf. Sci., Vol. 20, Berlin 1992, p. 83
  • 7. R.M. Feenstra, Phys. Rev. B, 50, 4561, 94
  • 8. J. Tersoff, D.R. Hamann, Phys. Rev B, 31, 805, 1985
  • 9. B. Susła, M. Giersig, R. Czajka, M. Kamiński, Physica C, 387, 221, 2003
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv104n309kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.