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Abstracts
In this work we employ technique of optically detected cyclotron resonance for evaluation of the role of localization processes in CdTe/CdMnTe and CdMnTe/CdMgTe quantum well structures. From microwave-induced changes of excitonic emissions we evaluate magnitude of potential fluctuations (Stokes shift), correlate optically detected cyclotron resonance results with the results of time-resolved experiments and discuss nature of recombination processes in the limit of a strong localization.
Discipline
Journal
Year
Volume
Issue
Pages
559-566
Physical description
Dates
published
2003-06
received
2003-05-30
Contributors
author
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
- College of Science, Cardinal S. Wyszyński University, Warsaw, Poland
author
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
- Dept. of Physics and Meas. Techn., Linköping University, 581 83 Linköping, Sweden
author
- Dept. of Physics and Meas. Techn., Linköping University, 581 83 Linköping, Sweden
author
- Institute of Semiconductor Physics, SB RAN, Novosibirsk 630090, Russia
author
- Institute of Semiconductor Physics, SB RAN, Novosibirsk 630090, Russia
author
- Institute of Solid State Physics, Bremen University, 28334 Bremen, Germany
author
- Institute of Solid State Physics, Bremen University, 28334 Bremen, Germany
References
- 1. M. Godlewski, Mater. Sci. Forum, Solid State Phys. Eng., 297/298, 197, 1999
- 2. S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Matushita, T. Mukai, MRS Internet J. Nitride Semicond. Res., 4S1, G1.1, 1999
- 3. M. Godlewski, W.M. Chen, B. Monemar, CRC Crit. Rev. Solid State Mater. Sci., 19, 241, 1994
- 4. M. Godlewski, Opt. Appl., 30, 463, 2000
- 5. M. Godlewski, J.P. Bergman, B. Monemar, E. Kurtz, D. Hommel, Appl. Phys. Lett., 69, 2843, 1996
- 6. A.E. Zhukov, V.M. Ustinov, A.Yu. Egorov, A.R. Kovsh, A.F. Tsatsulnikov, N.N. Ledentsov, S.V. Zaitsev, N.Yu. Gordeev, P.S. Kopev, Z.I. Alferov, Jpn. J. Appl. Phys., 36, 4216, 1997
- 7. G. Karczewski, S. Mackowski, M. Kutrowski, T. Wojtowicz, J. Kossut, Appl. Phys. Lett., 74, 3011, 1999
- 8. M. Godlewski, V.Yu. Ivanov, A. Khachapuridze, R. Narkowicz, P.J. Bergman, B. Monemar, Mater. Sci. Forum, 384/385, 19, 2002
- 9. M. Godlewski, V.Yu. Ivanov, A. Khachapuridze, S. Yatsunenko, Phys. Status Solidi B, 229, 533, 2002
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv103n607kz